Presentation 1999/1/21
Emission characteristics of thin-film top-layer scandate cathodes
Eiichirou Uda, Osamu Nakamura, Sadao Matsumoto, Toshiharu Higuchi,
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Abstract(in English) We investigated top-layer scandate cathodes, which are the most promising of scandate cathodes. Among the cathodes which we prepared with a layer of various thickness, the best pulse emission of 80A/cm^2 at 1300K was recorded with cathodes having a top-layer consisting of a Sc_2O_3 layer 2 nm thick on a W layer 8 nm thick. The emission variation of these cathodes was evaluated in life tests. The life characteristics were good in both diode and triode evaluation. We also determined diffusion coefficients of W and Sc_2O_3 with unporous W pellets covered with Sc_2O_3 and W layer. Variation of surface concentrations of these pellets during life tests were measured using Auger electron spectroscopy. The diffusion coefficients were 6.4×10^<-19>, 1.0×10^<-18>, and 1.6×10^<-18>cm^2/s at 1220K, 1300K, and 1370K, respectively. Detailed observation of Auger spectra suggests unchanged chemical states of O, Sc, and W during diffusion process.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Thermionic electron emission / scandate cathode / thin film / bulk diffusion / scandium oxide / tungsten
Paper # EID98-90
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Committee EID
Conference Date 1999/1/21(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Emission characteristics of thin-film top-layer scandate cathodes
Sub Title (in English)
Keyword(1) Thermionic electron emission
Keyword(2) scandate cathode
Keyword(3) thin film
Keyword(4) bulk diffusion
Keyword(5) scandium oxide
Keyword(6) tungsten
1st Author's Name Eiichirou Uda
1st Author's Affiliation Electron tubes and devices division, Toshiba corporation()
2nd Author's Name Osamu Nakamura
2nd Author's Affiliation Electron tubes and devices division, Toshiba corporation
3rd Author's Name Sadao Matsumoto
3rd Author's Affiliation Electron tubes and devices division, Toshiba corporation
4th Author's Name Toshiharu Higuchi
4th Author's Affiliation Electron tubes and devices division, Toshiba corporation
Date 1999/1/21
Paper # EID98-90
Volume (vol) vol.98
Number (no) 549
Page pp.pp.-
#Pages 6
Date of Issue