Presentation 1999/1/21
Surface Potential of Phosphor Under Low Energy Electron Irradiation
H. Kominami, T. Aoki, Y. Nakanishi, Y. Hatanaka,
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Abstract(in English) The surface potential of ZnS:Ag, Cl phosphor coated with In_2O_3 conducting layer under low energy electron excitation was investigated. The mesh electrode was fabricated on the phosphor sample, then, mesh and sample currents were measured as a function of mesh voltage. The mesh and sample currents changed abruptly at mesh voltage corresponding to the surface potential. The surface potential changed according with the weight of In[OCH(CH_3)_2]_3. It is suggested that the pronounced charging-up occurs at the excitation voltage lower than 200V in ZnS:Ag, Cl phosphor. It should be emphasized that this method was very effective for the measurement of surface potential. Moreover, the incident electron energy was increased with respect to the coating ratio. It indicated that the resistivity of the phosphor surface decreased by the coating process.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) FED / Low voltage CL / ZnS:Ag, Cl / Surface potential / Secondary electron yield
Paper # EID98-80
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Committee EID
Conference Date 1999/1/21(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Surface Potential of Phosphor Under Low Energy Electron Irradiation
Sub Title (in English)
Keyword(1) FED
Keyword(2) Low voltage CL
Keyword(3) ZnS:Ag, Cl
Keyword(4) Surface potential
Keyword(5) Secondary electron yield
1st Author's Name H. Kominami
1st Author's Affiliation Graduate School of Electronic Science and Technology, Shizuoka University()
2nd Author's Name T. Aoki
2nd Author's Affiliation Graduate School of Electronic Science and Technology, Shizuoka University
3rd Author's Name Y. Nakanishi
3rd Author's Affiliation Graduate School of Electronic Science and Technology, Shizuoka University:Research Institute of Electronics, Shizuoka University
4th Author's Name Y. Hatanaka
4th Author's Affiliation Graduate School of Electronic Science and Technology, Shizuoka University:Research Institute of Electronics, Shizuoka University
Date 1999/1/21
Paper # EID98-80
Volume (vol) vol.98
Number (no) 549
Page pp.pp.-
#Pages 6
Date of Issue