Presentation | 1994/6/24 Forming processes of ZnS:TbF_3 analyzed by Transmission Electron Microscope Toshitaka Nishikubo, Eiichi Kitazume, Heiju Uchiike, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Forming processes of ZnS:TbF_3 thin films and ZnS thin films were analyzed by TEM.And Annealing effects on ZnS:TbF_3 were obserbed using TEM.Accordingly the following results are obtained, (1)Forming processes of ZnS,ani ZnS:TbF_3 were investigated.(2)Th atoms or particles disturb the formation of recrystalization of ZnS film.(3)Grainsize grow larger by annealing. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | TEM / ZnS / ZnS:TbF_3 / annealing |
Paper # | EID94-20 |
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Committee | EID |
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Conference Date | 1994/6/24(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Forming processes of ZnS:TbF_3 analyzed by Transmission Electron Microscope |
Sub Title (in English) | |
Keyword(1) | TEM |
Keyword(2) | ZnS |
Keyword(3) | ZnS:TbF_3 |
Keyword(4) | annealing |
1st Author's Name | Toshitaka Nishikubo |
1st Author's Affiliation | Faculty of Engineering,Hiroshima University() |
2nd Author's Name | Eiichi Kitazume |
2nd Author's Affiliation | Faculty of Engineering,Hiroshima University |
3rd Author's Name | Heiju Uchiike |
3rd Author's Affiliation | Faculty of Engineering,Hiroshima University |
Date | 1994/6/24 |
Paper # | EID94-20 |
Volume (vol) | vol.94 |
Number (no) | 123 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |