Presentation 1994/6/24
Forming processes of ZnS:TbF_3 analyzed by Transmission Electron Microscope
Toshitaka Nishikubo, Eiichi Kitazume, Heiju Uchiike,
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Abstract(in English) Forming processes of ZnS:TbF_3 thin films and ZnS thin films were analyzed by TEM.And Annealing effects on ZnS:TbF_3 were obserbed using TEM.Accordingly the following results are obtained, (1)Forming processes of ZnS,ani ZnS:TbF_3 were investigated.(2)Th atoms or particles disturb the formation of recrystalization of ZnS film.(3)Grainsize grow larger by annealing.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) TEM / ZnS / ZnS:TbF_3 / annealing
Paper # EID94-20
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Committee EID
Conference Date 1994/6/24(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Forming processes of ZnS:TbF_3 analyzed by Transmission Electron Microscope
Sub Title (in English)
Keyword(1) TEM
Keyword(2) ZnS
Keyword(3) ZnS:TbF_3
Keyword(4) annealing
1st Author's Name Toshitaka Nishikubo
1st Author's Affiliation Faculty of Engineering,Hiroshima University()
2nd Author's Name Eiichi Kitazume
2nd Author's Affiliation Faculty of Engineering,Hiroshima University
3rd Author's Name Heiju Uchiike
3rd Author's Affiliation Faculty of Engineering,Hiroshima University
Date 1994/6/24
Paper # EID94-20
Volume (vol) vol.94
Number (no) 123
Page pp.pp.-
#Pages 6
Date of Issue