Presentation 1994/2/18
Phase transformation of amorphous silicon by excimer laser annealing and its application to thin film transtors
Naoto Kusumoto, Nobuo Kubo, Shunpei Yamazaki,
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Abstract(in English) The phase transformation of amorphous silicon by excimer laser annealing is investigated by ellipsometry,Raman spectra and SEM. The surface roughness is the measure of the crystal growth,and the increase of the roughness and the phase transition to polycrystalline-Si are detected by the Raman intensity.There is a good relation between the field effect mobility and the Raman intensity,but the grain size is out of proportion to the mobility. When the laser intensity exceeds the certain value,the a-Si film shows the ablation effect and it is seen that the incubation period is necessary to start the crystal growth.The incubated films become the poly-Si with high mobility and some large grain size.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Thin film transistors / Polycrystalline-Si / Raman spectra / Ellipsometry / Grain growth / Excimer laser annealing
Paper # EID93-132,ED93-186,SDM93-209
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Committee EID
Conference Date 1994/2/18(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Phase transformation of amorphous silicon by excimer laser annealing and its application to thin film transtors
Sub Title (in English)
Keyword(1) Thin film transistors
Keyword(2) Polycrystalline-Si
Keyword(3) Raman spectra
Keyword(4) Ellipsometry
Keyword(5) Grain growth
Keyword(6) Excimer laser annealing
1st Author's Name Naoto Kusumoto
1st Author's Affiliation Semiconductor Energy Laboratory()
2nd Author's Name Nobuo Kubo
2nd Author's Affiliation Semiconductor Energy Laboratory GTC
3rd Author's Name Shunpei Yamazaki
3rd Author's Affiliation Semiconductor Energy Laboratory
Date 1994/2/18
Paper # EID93-132,ED93-186,SDM93-209
Volume (vol) vol.93
Number (no) 471
Page pp.pp.-
#Pages 6
Date of Issue