Presentation 1994/2/17
Improvement of image-sticking in TFD-LCD
Kazushi Miyake, Takashi Nakamura, Takanori Hirai, Miyuki Watanabe, Yuuji Abe, Shinichi Kamagami, Hiroshi Morita,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) I-V characteristics shift has been confirmed to be a cause of imagesticking on TFD-LCD.Image-sticking time is proportional to I- V characteristic shift,and the smaller shift provides shorter image-sticking time.The I-Vcharacteristic shift can be reduced by high temperature heat treatment.The temperature and anodic oxidization voltage,however,must be optimized,because the high temperature heat-treatment degrades the contrast ratio.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) TFD-LCD / Image-sticking / I-V characteristic shift / Heat- treatment
Paper # EID93-129,ED93-183,SDM93-206
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Committee EID
Conference Date 1994/2/17(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improvement of image-sticking in TFD-LCD
Sub Title (in English)
Keyword(1) TFD-LCD
Keyword(2) Image-sticking
Keyword(3) I-V characteristic shift
Keyword(4) Heat- treatment
1st Author's Name Kazushi Miyake
1st Author's Affiliation Display Device Engineering Laboratory,Toshiba()
2nd Author's Name Takashi Nakamura
2nd Author's Affiliation Display Device Engineering Laboratory,Toshiba
3rd Author's Name Takanori Hirai
3rd Author's Affiliation Display Device Engineering Laboratory,Toshiba
4th Author's Name Miyuki Watanabe
4th Author's Affiliation Display Device Engineering Laboratory,Toshiba
5th Author's Name Yuuji Abe
5th Author's Affiliation Electronic Engineering,Toshiba
6th Author's Name Shinichi Kamagami
6th Author's Affiliation Display Devics Enginrring Laboratory,Toshiba
7th Author's Name Hiroshi Morita
7th Author's Affiliation Display Devics Enginrring Laboratory,Toshiba
Date 1994/2/17
Paper # EID93-129,ED93-183,SDM93-206
Volume (vol) vol.93
Number (no) 470
Page pp.pp.-
#Pages 6
Date of Issue