| Presentation | 1994/1/20 Evalution of ZnS:TbF_3 thin film EL Toshitaka Nishikubo, Toshikazu Mori, Heiju Uchiike, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | ZnS:TbF_3 thin films were observed using TEM and X-ray diffraction.Strcture of TbF_3 was investigated.Accordingly the following results are obtained,(1)Tb atoms or particles disturb the formation of recrystalization of ZnS film.(2)The structure of TbF_3 belongs to YF_3 type orthorhombic system.(3)Grainsize grow larger by annealing. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | TEM / X-ray diffraction / Orthorhombic crystal / Annealing effect |
| Paper # | EID93-109,IDY94-11,MD-94-11 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 1994/1/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evalution of ZnS:TbF_3 thin film EL |
| Sub Title (in English) | |
| Keyword(1) | TEM |
| Keyword(2) | X-ray diffraction |
| Keyword(3) | Orthorhombic crystal |
| Keyword(4) | Annealing effect |
| 1st Author's Name | Toshitaka Nishikubo |
| 1st Author's Affiliation | Faculty of Engineering,Hiroshima University() |
| 2nd Author's Name | Toshikazu Mori |
| 2nd Author's Affiliation | Faculty of Engineering,Hiroshima University |
| 3rd Author's Name | Heiju Uchiike |
| 3rd Author's Affiliation | Faculty of Engineering,Hiroshima University |
| Date | 1994/1/20 |
| Paper # | EID93-109,IDY94-11,MD-94-11 |
| Volume (vol) | vol.93 |
| Number (no) | 428 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |