Presentation 1993/6/25
Evaluation of ZnS:TbF_3 thin film EL
Toshitaka Nishikubo, Toshikazu Mori, Heiju Uchiike,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) ZnS:TbF_3 thin films were observed using TEM and X-ray diffraction.Strcture of TbF_3 was investigated.Accordingly the following results are obtained,(1) Tb atoms or particles disturb the formation of recrystalization of ZnS film.(2)The structure of TbF_3 belongs to YF_3 type orthorhombic system.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) TEM / X-ray diffraction / Orthorhombic crystal
Paper # EID93-10,IE93-26
Date of Issue

Conference Information
Committee EID
Conference Date 1993/6/25(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Vice Chair

Paper Information
Registration To Electronic Information Displays (EID)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of ZnS:TbF_3 thin film EL
Sub Title (in English)
Keyword(1) TEM
Keyword(2) X-ray diffraction
Keyword(3) Orthorhombic crystal
1st Author's Name Toshitaka Nishikubo
1st Author's Affiliation Department of Engineering,Graduate School,Hiroshima University()
2nd Author's Name Toshikazu Mori
2nd Author's Affiliation Department of Engineering,Graduate School,Hiroshima University
3rd Author's Name Heiju Uchiike
3rd Author's Affiliation Department of Erectricity,Faculty of Engineering,Hiroshima University
Date 1993/6/25
Paper # EID93-10,IE93-26
Volume (vol) vol.93
Number (no) 108
Page pp.pp.-
#Pages 6
Date of Issue