Presentation | 1993/6/25 Evaluation of ZnS:TbF_3 thin film EL Toshitaka Nishikubo, Toshikazu Mori, Heiju Uchiike, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | ZnS:TbF_3 thin films were observed using TEM and X-ray diffraction.Strcture of TbF_3 was investigated.Accordingly the following results are obtained,(1) Tb atoms or particles disturb the formation of recrystalization of ZnS film.(2)The structure of TbF_3 belongs to YF_3 type orthorhombic system. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | TEM / X-ray diffraction / Orthorhombic crystal |
Paper # | EID93-10,IE93-26 |
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Conference Information | |
Committee | EID |
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Conference Date | 1993/6/25(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Evaluation of ZnS:TbF_3 thin film EL |
Sub Title (in English) | |
Keyword(1) | TEM |
Keyword(2) | X-ray diffraction |
Keyword(3) | Orthorhombic crystal |
1st Author's Name | Toshitaka Nishikubo |
1st Author's Affiliation | Department of Engineering,Graduate School,Hiroshima University() |
2nd Author's Name | Toshikazu Mori |
2nd Author's Affiliation | Department of Engineering,Graduate School,Hiroshima University |
3rd Author's Name | Heiju Uchiike |
3rd Author's Affiliation | Department of Erectricity,Faculty of Engineering,Hiroshima University |
Date | 1993/6/25 |
Paper # | EID93-10,IE93-26 |
Volume (vol) | vol.93 |
Number (no) | 108 |
Page | pp.pp.- |
#Pages | 6 |
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