Presentation | 1996/2/20 Evaluation of Thin Films for EL Phosphor Layer Masaru Kawata, Heiju Uchiike, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We fabricated the phosphor layer of TFEL devices using the electron beam evaporation method. The mixture of SrS:CeCl_3 and ZnS was used as a source pellet. The composition ratio of thin films was evaluated by RBS and PIXE. The structure and crystallinity of thin films were evaluated by SEM and XRD. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Phosphor Layer / SrS: CeCl_3 Thin Films |
Paper # | EID95-109,ED95-183,SDM95-223 |
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Conference Information | |
Committee | EID |
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Conference Date | 1996/2/20(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Evaluation of Thin Films for EL Phosphor Layer |
Sub Title (in English) | |
Keyword(1) | Phosphor Layer |
Keyword(2) | SrS: CeCl_3 Thin Films |
1st Author's Name | Masaru Kawata |
1st Author's Affiliation | Faculty of Engineering,Hiroshima University() |
2nd Author's Name | Heiju Uchiike |
2nd Author's Affiliation | Faculty of Engineering,Hiroshima University |
Date | 1996/2/20 |
Paper # | EID95-109,ED95-183,SDM95-223 |
Volume (vol) | vol.95 |
Number (no) | 525 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |