Presentation 1996/2/20
Evaluation of Thin Films for EL Phosphor Layer
Masaru Kawata, Heiju Uchiike,
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Abstract(in English) We fabricated the phosphor layer of TFEL devices using the electron beam evaporation method. The mixture of SrS:CeCl_3 and ZnS was used as a source pellet. The composition ratio of thin films was evaluated by RBS and PIXE. The structure and crystallinity of thin films were evaluated by SEM and XRD.
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Keyword(in English) Phosphor Layer / SrS: CeCl_3 Thin Films
Paper # EID95-109,ED95-183,SDM95-223
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Committee EID
Conference Date 1996/2/20(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Evaluation of Thin Films for EL Phosphor Layer
Sub Title (in English)
Keyword(1) Phosphor Layer
Keyword(2) SrS: CeCl_3 Thin Films
1st Author's Name Masaru Kawata
1st Author's Affiliation Faculty of Engineering,Hiroshima University()
2nd Author's Name Heiju Uchiike
2nd Author's Affiliation Faculty of Engineering,Hiroshima University
Date 1996/2/20
Paper # EID95-109,ED95-183,SDM95-223
Volume (vol) vol.95
Number (no) 525
Page pp.pp.-
#Pages 6
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