| Presentation | 1995/6/22 Two-dimensional Beam Diagnostics method for Intense Ion Beams : Two-dimensional divergence distribution measuring method Kazuhito Yasuike, Shuji Miyamoto, Kazuo Imasaki, Sadao Nakai, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Two-dimensional temporally resolved beam diagnostic method for intense ion beams, intended for ion beam fusion, is developed. This is an extension of one-dimensional Arrayed Pinhole Camera (APC) with time integrated detector. [K.Yasuike, S.Miyamoto and S.Nakai, Review of Scientific Instruments, (to be published).] A two-dimensional correlation analysis of the arrayed images yields an intensity distribution and an angular two-dimensional distributions (beam divergence) of pulsed ion beam. A temporal resolution is obtained by using a gated micro channel plate (MCP) as a time resolved ion detector. Achieved spatial and angular resolutions are smaller than 1 mm and better than 20mrad, respectively. A temporal resolution is about 15ns that is determined by a width of the gating pulse and a MCP gain characteristic. This two-dimensional APC was successfully tested on a magnetically insulated pulsed ion diode, which generates an annular Proton [H^+] beam of energy 1MV, current density of ～10A/cm^2, pulse duration of 100 ns. The results show that the ion beams accelerated by the magnetically insulated diode have direction-dependent beam divergence. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Arrayed Pinhole Camera / APC / Divergence / Ion beam / Ion diode |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 1995/6/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Two-dimensional Beam Diagnostics method for Intense Ion Beams : Two-dimensional divergence distribution measuring method |
| Sub Title (in English) | |
| Keyword(1) | Arrayed Pinhole Camera |
| Keyword(2) | APC |
| Keyword(3) | Divergence |
| Keyword(4) | Ion beam |
| Keyword(5) | Ion diode |
| 1st Author's Name | Kazuhito Yasuike |
| 1st Author's Affiliation | Institute of Laser Engineering, Osaka University() |
| 2nd Author's Name | Shuji Miyamoto |
| 2nd Author's Affiliation | Institute of Laser Engineering, Osaka University |
| 3rd Author's Name | Kazuo Imasaki |
| 3rd Author's Affiliation | Institute for Laser Technology |
| 4th Author's Name | Sadao Nakai |
| 4th Author's Affiliation | Institute of Laser Engineering, Osaka University |
| Date | 1995/6/22 |
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| Volume (vol) | vol.95 |
| Number (no) | 114 |
| Page | pp.pp.- |
| #Pages | 6 |
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