Presentation 1998/1/30
Simplified Screen Inspection Method for TFT-LCD Panels
Shinichi Hoshino, Seiichiro Hori, Hideyuki Imura, Tomohiro Murata, Eiji Yamamoto,
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Abstract(in English) In the fabrication process of TFT-LCD, the screen inspection before mounting of driving LSI is necessary for improving its productivity. A conventional screen inspection was carried out by temporarily connecting many probes to the corresponding electrodes on LCD panel. But this conventional method has some problem such as poor productivity by adjusting the position of the probes quite precisely, expensiveness by remaking the new probes for every LCD panel and maintaining the probes themselves. In this report, we will introduce the simplified Screen inspection method which has resolved the above mentioned problems.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) LCD / Inspection / Laser cut
Paper # EID97-113
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Committee EID
Conference Date 1998/1/30(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Simplified Screen Inspection Method for TFT-LCD Panels
Sub Title (in English)
Keyword(1) LCD
Keyword(2) Inspection
Keyword(3) Laser cut
1st Author's Name Shinichi Hoshino
1st Author's Affiliation Matsushita Electric Industrial Co., Ltd.()
2nd Author's Name Seiichiro Hori
2nd Author's Affiliation Matsushita Electric Industrial Co., Ltd.
3rd Author's Name Hideyuki Imura
3rd Author's Affiliation Matsushita Electric Industrial Co., Ltd.
4th Author's Name Tomohiro Murata
4th Author's Affiliation Matsushita Electric Industrial Co., Ltd.
5th Author's Name Eiji Yamamoto
5th Author's Affiliation Matsushita Electric Industrial Co., Ltd.
Date 1998/1/30
Paper # EID97-113
Volume (vol) vol.97
Number (no) 520
Page pp.pp.-
#Pages 5
Date of Issue