Presentation | 1997/3/7 Voltage Holding Ratio evaluation of LC Materials with Negative Dielectric Anisotropy Yuji Nakazono, Hideo Ichinose, Atsushi Sawada, Shohei Naemura, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Evaluation of voltage holding ratio of LC materials with negative dielectric anisotropy is performed. From the result, it was found that ion density and ion mobility is increased in materials which has poor voltage holding ratio property. Calculation of energy of dissociation was also performed on each materials with temperature dependency of ion density. From this calculation, it was assumed that different ionizable organic is existing in the each materials. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | AM-LCD / voltage holding ratio / ion / energy of dissociation |
Paper # | EID96-178,OME96-96 |
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Conference Information | |
Committee | EID |
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Conference Date | 1997/3/7(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Electronic Information Displays (EID) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Voltage Holding Ratio evaluation of LC Materials with Negative Dielectric Anisotropy |
Sub Title (in English) | |
Keyword(1) | AM-LCD |
Keyword(2) | voltage holding ratio |
Keyword(3) | ion |
Keyword(4) | energy of dissociation |
1st Author's Name | Yuji Nakazono |
1st Author's Affiliation | Atsugi Technical Center, Merck Japan Limited() |
2nd Author's Name | Hideo Ichinose |
2nd Author's Affiliation | Atsugi Technical Center, Merck Japan Limited |
3rd Author's Name | Atsushi Sawada |
3rd Author's Affiliation | Atsugi Technical Center, Merck Japan Limited |
4th Author's Name | Shohei Naemura |
4th Author's Affiliation | Atsugi Technical Center, Merck Japan Limited |
Date | 1997/3/7 |
Paper # | EID96-178,OME96-96 |
Volume (vol) | vol.96 |
Number (no) | 567 |
Page | pp.pp.- |
#Pages | 6 |
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