Presentation 1998/5/14
Evaluation of Errors in a Radiation Pattern Caused by Reflections Using the Distance Changing Technique
Kazushi NISHIZAWA, Masahito SATO, Yoshihiko KONISHI, Isamu CHIBA, Takashi KATAGI,
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Abstract(in English) Authors have reported a method of detecting positions of reflection sources by applying the modified far-field antenna radiation pattern measurement scheme. In this method, it is difficult to separate reflections from measured data and evaluate each reflection in the case that reflection sources exist. In this paper, we propose a new method of separating reflections and evaluating each one by supressing sidelobe of Fourier spectrums using a window function on distance and by using gating these spectrums at each angle. And the validity of this method is confirmed by a computer simulation.
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Keyword(in English) Measurement method / Reflection source / Inverted Fourier transform / Window function / Gating / Radiation patterns
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Conference Date 1998/5/14(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Evaluation of Errors in a Radiation Pattern Caused by Reflections Using the Distance Changing Technique
Sub Title (in English)
Keyword(1) Measurement method
Keyword(2) Reflection source
Keyword(3) Inverted Fourier transform
Keyword(4) Window function
Keyword(5) Gating
Keyword(6) Radiation patterns
1st Author's Name Kazushi NISHIZAWA
1st Author's Affiliation Mitsubishi Electric Corporation()
2nd Author's Name Masahito SATO
2nd Author's Affiliation Mitsubishi Electric Corporation
3rd Author's Name Yoshihiko KONISHI
3rd Author's Affiliation Mitsubishi Electric Corporation
4th Author's Name Isamu CHIBA
4th Author's Affiliation Mitsubishi Electric Corporation
5th Author's Name Takashi KATAGI
5th Author's Affiliation Mitsubishi Electric Corporation
Date 1998/5/14
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Volume (vol) vol.98
Number (no) 46
Page pp.pp.-
#Pages 6
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