Presentation 2000/6/23
Reliability evaluation for the next generation node architecture
Hiroyuki Funakoshi, Hiroshi Niitsu, Hiroshi Sunaga,
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Abstract(in English) A next generation network architecture is proposed to cope with drastic increase in data / multimedia traffic. This architecture consists of three separate modules for data transmission, media conversion, and service handling. In this paper, we evaluate it from the viewpoint of reliability, under a long-distance telephony network model. Evaluation shows that the unavailability of this architecture is about the same as that of the existing architecture, but when trouble occurs, it affects a larger area. So we considered some countermeasures to increase its reliability. In particular, we evaluated the effectiveness of multi-homing, and we verified the technological feasibility using multi-homing.
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Keyword(in English) next generation network / reliability / multi-homing
Paper # SSE2000-61
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Conference Information
Committee SSE
Conference Date 2000/6/23(1days)
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Paper Information
Registration To Switching Systems Engineering (SSE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Reliability evaluation for the next generation node architecture
Sub Title (in English)
Keyword(1) next generation network
Keyword(2) reliability
Keyword(3) multi-homing
1st Author's Name Hiroyuki Funakoshi
1st Author's Affiliation NTT Network Service Systems Laboratories()
2nd Author's Name Hiroshi Niitsu
2nd Author's Affiliation NTT Network Service Systems Laboratories
3rd Author's Name Hiroshi Sunaga
3rd Author's Affiliation NTT Network Service Systems Laboratories
Date 2000/6/23
Paper # SSE2000-61
Volume (vol) vol.100
Number (no) 154
Page pp.pp.-
#Pages 6
Date of Issue