Presentation 2000/6/30
Extremely Low Crosstalk Characteristics of Optical ADM with Vertically Stacked Buried InGaAsP waveguides
Tomonori Yazaki, Masayoshi Horita, Shinsuke Tanaka, Yuichi Matsushima,
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Abstract(in English) Polarization insensitive optical ADM was demonstrated by introducing vertically stacked buried waveguides, and it was confirmed that a difference of peak wavelength between two orthogonal polarizations was reduced to as small as 0.03nm. Further, InGaAsP/InP deep grating was fabricated between vertically stacked waveguides in order to improve crosstalk characteristics. Extremely low crosstalk of -36dB was successfully achieved.
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Keyword(in English) Semiconductor OADM / Vertically stacked buried waveguides / Deep grating
Paper # OPE2000-34,LQE2000-28
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Conference Information
Committee LQE
Conference Date 2000/6/30(1days)
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Paper Information
Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Extremely Low Crosstalk Characteristics of Optical ADM with Vertically Stacked Buried InGaAsP waveguides
Sub Title (in English)
Keyword(1) Semiconductor OADM
Keyword(2) Vertically stacked buried waveguides
Keyword(3) Deep grating
1st Author's Name Tomonori Yazaki
1st Author's Affiliation KDD R&D Laboratories Inc.()
2nd Author's Name Masayoshi Horita
2nd Author's Affiliation KDD R&D Laboratories Inc.
3rd Author's Name Shinsuke Tanaka
3rd Author's Affiliation KDD R&D Laboratories Inc.
4th Author's Name Yuichi Matsushima
4th Author's Affiliation KDD R&D Laboratories Inc.
Date 2000/6/30
Paper # OPE2000-34,LQE2000-28
Volume (vol) vol.100
Number (no) 170
Page pp.pp.-
#Pages 6
Date of Issue