Presentation 2000/5/15
Improvement on a frequency stabilization method of a semiconductor laser using the Faraday effect of the Rb-D_2 absorption line
Toshiya Nimonji, Takashi Kato, Ryouichi Higashi, Takashi Sato, Masashi Ohkawa, Takeo Maruyama, Minoru Shimba,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The oscillation frequency stabilization of a semiconductor laser is usually demonstrated by the direct modulation of its injection current, although this method increases its oscillation width. This broadening of the oscillation width, however, must be removed in some application fields. We, therefore, stabilized the oscillation frequency of a semiconductor laser using the Faraday effect of the Rb-D_2 absorption line and the PEAK method, which we devised to obtain the reproducible and large control signal for the frequency stabilization. Our method modulates the reference frequency of the Rb-D_2 absorption line instead of the laser frequency, so the oscillation spectrum is not broadened by this stabilization method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) semiconductor laser / frequency stabilization / Rb absorption line / Faraday effect
Paper # LQE2000-11
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Committee LQE
Conference Date 2000/5/15(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improvement on a frequency stabilization method of a semiconductor laser using the Faraday effect of the Rb-D_2 absorption line
Sub Title (in English)
Keyword(1) semiconductor laser
Keyword(2) frequency stabilization
Keyword(3) Rb absorption line
Keyword(4) Faraday effect
1st Author's Name Toshiya Nimonji
1st Author's Affiliation Graduate School of Science and Technology, Niigata University()
2nd Author's Name Takashi Kato
2nd Author's Affiliation Graduate School of Science and Technology, Niigata University
3rd Author's Name Ryouichi Higashi
3rd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Niigata University
4th Author's Name Takashi Sato
4th Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Niigata University
5th Author's Name Masashi Ohkawa
5th Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Niigata University
6th Author's Name Takeo Maruyama
6th Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Niigata University
7th Author's Name Minoru Shimba
7th Author's Affiliation Faculty of Engineering, Tokyo Denki University
Date 2000/5/15
Paper # LQE2000-11
Volume (vol) vol.100
Number (no) 73
Page pp.pp.-
#Pages 6
Date of Issue