| Presentation | 2000/5/15 Detection of broadband terahertz radiation from GaAs depletion layers by using autocorrelation method Y. Shimada, T. Matsuno, K. Hirakawa, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We have investigated terahertz (THz) radiation from GaAs depletion layers excited by femtosecond laser pulses. Quasi-autocorrelation measurements were done on the emitted THz radiation by using a bolometer as a wideband detector. It is found that intense broadband THz pulses can be generated by applying large reverse-bias voltages and increasing the excitation power. Thus, it is promising as an intense broadband THz source. Furthermore, the ultrafast dynamics of nonequilibrium electron transport in the GaAs depletion layers has been discussed. The information on the overshoot of photoexcited electrons has been obtained. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | terahertz radiation / GaAs depletion layers / autocorrelation measurements |
| Paper # | LQE2000-4 |
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| Conference Information | |
| Committee | LQE |
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| Conference Date | 2000/5/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Lasers and Quantum Electronics (LQE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Detection of broadband terahertz radiation from GaAs depletion layers by using autocorrelation method |
| Sub Title (in English) | |
| Keyword(1) | terahertz radiation |
| Keyword(2) | GaAs depletion layers |
| Keyword(3) | autocorrelation measurements |
| 1st Author's Name | Y. Shimada |
| 1st Author's Affiliation | Institute of Industrial Science, University of Tokyo:CREST JST() |
| 2nd Author's Name | T. Matsuno |
| 2nd Author's Affiliation | Institute of Industrial Science, University of Tokyo |
| 3rd Author's Name | K. Hirakawa |
| 3rd Author's Affiliation | Institute of Industrial Science, University of Tokyo:CREST JST |
| Date | 2000/5/15 |
| Paper # | LQE2000-4 |
| Volume (vol) | vol.100 |
| Number (no) | 73 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |