Presentation 1999/8/27
High accurate self-aligned bonding for wafer level assembly
H. Nakata, G. Nakagawa, h. Nobuhara, K. Tanaka, M. Yano,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Wafer level assembly is a promising candidate for low-cost assembly of optical modules. Self-aligned bonding using solder surface tension which is an important technology in this assembly was studied. For improvement of bonding accuracy in horizontal direction, we adopted many small solder bumps for bonding of a chip and reflow process with strong deoxidization effect. For improvement of bonding accuracy in vertical direction, we adopted high accurate fabrication process of solder bumps. Consequently, we achieved submicron bonding accuracy in both horizontal and vertical directions. The tolerance at initial placement was 25μm which is about a half of bonding-pad diameter.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) wafer level assembly / self-aligned / bonding / submicron / accuracy / solder bump
Paper # LQE99-50
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Conference Information
Committee LQE
Conference Date 1999/8/27(1days)
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Paper Information
Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High accurate self-aligned bonding for wafer level assembly
Sub Title (in English)
Keyword(1) wafer level assembly
Keyword(2) self-aligned
Keyword(3) bonding
Keyword(4) submicron
Keyword(5) accuracy
Keyword(6) solder bump
1st Author's Name H. Nakata
1st Author's Affiliation Fujitsu Laboratories Ltd.()
2nd Author's Name G. Nakagawa
2nd Author's Affiliation Fujitsu Laboratories Ltd.
3rd Author's Name h. Nobuhara
3rd Author's Affiliation Fujitsu Laboratories Ltd.
4th Author's Name K. Tanaka
4th Author's Affiliation Fujitsu Laboratories Ltd.
5th Author's Name M. Yano
5th Author's Affiliation Fujitsu Laboratories Ltd.
Date 1999/8/27
Paper # LQE99-50
Volume (vol) vol.99
Number (no) 280
Page pp.pp.-
#Pages 6
Date of Issue