Presentation | 1999/1/19 Analysis of Leakage Current in Buried Heterostructure Lasers H. Watanabe, Y. Yoshida, K. Shibata, A. Takemoto, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The temperature characteristics of InGaAsP/InP buried heterostructure lasers with p-n-p-n blocking layers have been numerically analyzed using a two-dimensional (2-D) device simulator. According to the analysis of minority carrier flow, the characteristic temperature (To) in high temperature is determined by both of heterobarrier leakage and electrons flowing through the p-n-p-n blocking layers. Experimental estimation of electro-luminessance (EL) emitting from InP layers shows the obvious dependence on the width of blocking layers and well number in the active layer. These results are consistent with the simulation. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | buried heterostructure laser / simulation / temperature characteristics / leakage current |
Paper # | PS98-72,OPE98-121,LQE98-114 |
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Conference Information | |
Committee | LQE |
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Conference Date | 1999/1/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Lasers and Quantum Electronics (LQE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of Leakage Current in Buried Heterostructure Lasers |
Sub Title (in English) | |
Keyword(1) | buried heterostructure laser |
Keyword(2) | simulation |
Keyword(3) | temperature characteristics |
Keyword(4) | leakage current |
1st Author's Name | H. Watanabe |
1st Author's Affiliation | Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division() |
2nd Author's Name | Y. Yoshida |
2nd Author's Affiliation | Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division |
3rd Author's Name | K. Shibata |
3rd Author's Affiliation | Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division |
4th Author's Name | A. Takemoto |
4th Author's Affiliation | Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division |
Date | 1999/1/19 |
Paper # | PS98-72,OPE98-121,LQE98-114 |
Volume (vol) | vol.98 |
Number (no) | 509 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |