Presentation 1999/1/19
Analysis of Leakage Current in Buried Heterostructure Lasers
H. Watanabe, Y. Yoshida, K. Shibata, A. Takemoto,
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Abstract(in English) The temperature characteristics of InGaAsP/InP buried heterostructure lasers with p-n-p-n blocking layers have been numerically analyzed using a two-dimensional (2-D) device simulator. According to the analysis of minority carrier flow, the characteristic temperature (To) in high temperature is determined by both of heterobarrier leakage and electrons flowing through the p-n-p-n blocking layers. Experimental estimation of electro-luminessance (EL) emitting from InP layers shows the obvious dependence on the width of blocking layers and well number in the active layer. These results are consistent with the simulation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) buried heterostructure laser / simulation / temperature characteristics / leakage current
Paper # PS98-72,OPE98-121,LQE98-114
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Committee LQE
Conference Date 1999/1/19(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of Leakage Current in Buried Heterostructure Lasers
Sub Title (in English)
Keyword(1) buried heterostructure laser
Keyword(2) simulation
Keyword(3) temperature characteristics
Keyword(4) leakage current
1st Author's Name H. Watanabe
1st Author's Affiliation Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division()
2nd Author's Name Y. Yoshida
2nd Author's Affiliation Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division
3rd Author's Name K. Shibata
3rd Author's Affiliation Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division
4th Author's Name A. Takemoto
4th Author's Affiliation Mitsubishi Electric Corporation, High Frequency & Optical Semiconductor Division
Date 1999/1/19
Paper # PS98-72,OPE98-121,LQE98-114
Volume (vol) vol.98
Number (no) 509
Page pp.pp.-
#Pages 6
Date of Issue