Presentation 1997/10/14
Highly Reliable Operation of InGaAlAs Waveguide PD for Optical Access Networks
M. Shishikura, H. Nakamura, K. Nagatsuma, Y. Matsuoka, S. Tanaka, T. Ono, S. Tsuji,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Highly efficient and reliable operation of waveguide PD was investigated for low cost optical modules using surface-hybrid integration for optical access networks. High responsivity of 0.98A/W and wide coupling tolerance of 4μm to the flat-ended dispersion shifted fiber (DSF) was obtained. The median lifetime at a bias voltage of 10V at 85℃ in nitrogen atmosphere is estimated to be about a hundred milion hours by high temperature aging tests. Moreover, the median lifetime at 45℃/50% RH condition is expected to be more than 20 years by silicone-based polymer encapsulation. The mesa waveguide PD is demonstrated to be sufficiently reliable under humid conditions for use in low-cost nonhermetic optical modules used to construct optical access networks.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Optical access networks / waveguide PD / passive alignment / surface-hybrid integration / polymer encapsulation / low cost
Paper # LQE97-67-83
Date of Issue

Conference Information
Committee LQE
Conference Date 1997/10/14(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Highly Reliable Operation of InGaAlAs Waveguide PD for Optical Access Networks
Sub Title (in English)
Keyword(1) Optical access networks
Keyword(2) waveguide PD
Keyword(3) passive alignment
Keyword(4) surface-hybrid integration
Keyword(5) polymer encapsulation
Keyword(6) low cost
1st Author's Name M. Shishikura
1st Author's Affiliation Central Research Laboratory, Hitachi Ltd.()
2nd Author's Name H. Nakamura
2nd Author's Affiliation Central Research Laboratory, Hitachi Ltd.
3rd Author's Name K. Nagatsuma
3rd Author's Affiliation Central Research Laboratory, Hitachi Ltd.
4th Author's Name Y. Matsuoka
4th Author's Affiliation Central Research Laboratory, Hitachi Ltd.
5th Author's Name S. Tanaka
5th Author's Affiliation Central Research Laboratory, Hitachi Ltd.
6th Author's Name T. Ono
6th Author's Affiliation Hitachi Device Engineering Co. Ltd.
7th Author's Name S. Tsuji
7th Author's Affiliation Central Research Laboratory, Hitachi Ltd.
Date 1997/10/14
Paper # LQE97-67-83
Volume (vol) vol.97
Number (no) 313
Page pp.pp.-
#Pages 6
Date of Issue