Presentation 1997/1/17
Fabrication of Nitride Based Laser Diodes and Analysis of Dislocation Motion in Nitride Based Materials
L. Sugiura, M. Onomura, K. Itaya,
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Abstract(in English) We demonstrate room temperature pulsed operation of nitride based multi-quantum-well (MQW) laser diodes with cleaved mirror facets grown on a conventional c-face sapphire substrate. A single peak emission, at a wavelength of 417.5nm, with a full width at half-maximum of 0.15nm, was obtained. The threshold current density of the laser was 50kA/cm^2. The reliability of nitride based light emitting devices was also investigated from the theoretical viewpoint of dislocation motion. The dislocation velocities of the nitride based materials was found to be much lower than that of other light emitting materials, such as GaAs or InGaAsP, around room temperature.
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Keyword(in English) GaN-based materials / semiconductor laser diodes / dislocation motion
Paper # OPE96-143,LQE97-141
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Committee OPE
Conference Date 1997/1/17(1days)
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Registration To Optoelectronics (OPE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fabrication of Nitride Based Laser Diodes and Analysis of Dislocation Motion in Nitride Based Materials
Sub Title (in English)
Keyword(1) GaN-based materials
Keyword(2) semiconductor laser diodes
Keyword(3) dislocation motion
1st Author's Name L. Sugiura
1st Author's Affiliation Toshiba Research & Developement Center, Materials and Devices Laboratories()
2nd Author's Name M. Onomura
2nd Author's Affiliation Toshiba Research & Developement Center, Materials and Devices Laboratories
3rd Author's Name K. Itaya
3rd Author's Affiliation Toshiba Research & Developement Center, Materials and Devices Laboratories
Date 1997/1/17
Paper # OPE96-143,LQE97-141
Volume (vol) vol.96
Number (no) 445
Page pp.pp.-
#Pages 6
Date of Issue