| Presentation | 1998/2/12 Simultaneous Measurement of Wavelength-Dispersive Refractive Index and Thickness using the Low Coherence Interferometry : Precise Measurement Applicable for Evaluation of Hardening of UV-light Cured Epoxy H. Maruyama, T. Mitsuyama, Y. Kiyomura, T. Miyazaki, M. Haruna, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Simultaneous measurement of refractive index n and thickness t of transparent plates based on the low coherence interferometry have been developed by the authers.In this method, the wavelength dispersion must be considered for precise index measurement of the order of 0.1%.It is here demonstrated that phase and group indices, n_p and n_g, can be measured separately.This result lead to a new technique for simultaneous measurement of n_p and t where the index difference (n_g -n_p) is approximately expressed in terms of n_p (or two measured values).This technique is successfully applied to evaluation of hardenig of UV-cured epoxy, in comparison to the existing method, where n_p of the epoxy was measured with an error of nearly 0.2% |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Low coherence interferometry / Simultaneous measurement of index and thickness, Phase and group indices, Evaluation of hardening of UV-light-cured epoxy |
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| Conference Information | |
| Committee | OPE |
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| Conference Date | 1998/2/12(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Optoelectronics (OPE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Simultaneous Measurement of Wavelength-Dispersive Refractive Index and Thickness using the Low Coherence Interferometry : Precise Measurement Applicable for Evaluation of Hardening of UV-light Cured Epoxy |
| Sub Title (in English) | |
| Keyword(1) | Low coherence interferometry |
| Keyword(2) | Simultaneous measurement of index and thickness, Phase and group indices, Evaluation of hardening of UV-light-cured epoxy |
| 1st Author's Name | H. Maruyama |
| 1st Author's Affiliation | Material & Component Res.Lab., Kyushu Matsushita Electric Co., Ltd.() |
| 2nd Author's Name | T. Mitsuyama |
| 2nd Author's Affiliation | Course of Electronic Engineering, Graduate School of Engineering, Osaka University |
| 3rd Author's Name | Y. Kiyomura |
| 3rd Author's Affiliation | Material & Component Res.Lab., Kyushu Matsushita Electric Co., Ltd. |
| 4th Author's Name | T. Miyazaki |
| 4th Author's Affiliation | Material & Component Res.Lab., Kyushu Matsushita Electric Co., Ltd. |
| 5th Author's Name | M. Haruna |
| 5th Author's Affiliation | School of Allied Health Sciences, Faculty of Medicine, Osaka University |
| Date | 1998/2/12 |
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| Volume (vol) | vol.97 |
| Number (no) | 539 |
| Page | pp.pp.- |
| #Pages | 6 |
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