| Presentation | 1996/1/18 Simultaneous Measurement of Refractive Index and thickness of Transparent Plates by Low Coherence lnterferometry -Experimental Verification of the Object Scanning Method- T Tajiri, T Shiraishi, M Ohmi, M Haruna, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In the last OPE meeting, we proposed a novel technique for simultaneous measurement of the refractive index and thickness of transparent plates (used as a measured object), based on the low coherence interferometry, in which either a measured object or a focusing lens was scanned with a precise translation stage. This paper presents the experimental verification of the so-called object scanning method as well as the measurement accuracy. In our present measurement system, the measurement accuracy of ±0.3% was achieved for the plate thickness t of nearly 1mm, showing the validity of the proposed method. It is fully expected to obtain the accuracy of 0.1% when t ±100μm, by the use of more precise translation stages with a 0.1μm/step. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Low coherence light source / Simultaneous measurement of refractive index and thickness / Interferometry / Optomechatronics |
| Paper # | OPE95-121 |
| Date of Issue |
| Conference Information | |
| Committee | OPE |
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| Conference Date | 1996/1/18(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Optoelectronics (OPE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Simultaneous Measurement of Refractive Index and thickness of Transparent Plates by Low Coherence lnterferometry -Experimental Verification of the Object Scanning Method- |
| Sub Title (in English) | |
| Keyword(1) | Low coherence light source |
| Keyword(2) | Simultaneous measurement of refractive index and thickness |
| Keyword(3) | Interferometry |
| Keyword(4) | Optomechatronics |
| 1st Author's Name | T Tajiri |
| 1st Author's Affiliation | Course of Electronic Engineering, Graduate School of Engineering, Osaka Untiversity() |
| 2nd Author's Name | T Shiraishi |
| 2nd Author's Affiliation | Course of Electronic Engineering, Graduate School of Engineering, Osaka Untiversity |
| 3rd Author's Name | M Ohmi |
| 3rd Author's Affiliation | department of Allied Health Sciences, Faculty of Medicine, osaka Urniversity |
| 4th Author's Name | M Haruna |
| 4th Author's Affiliation | department of Allied Health Sciences, Faculty of Medicine, osaka Urniversity |
| Date | 1996/1/18 |
| Paper # | OPE95-121 |
| Volume (vol) | vol.95 |
| Number (no) | 459 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |