Presentation 2001/1/9
Degradation of Nickel-Cadmium Batteries for Cordless Telephones and Reliability of a Battery Checker on Capacity Estimation
Akira Yamashita, Toshiro Hirai, Masayasu Arakawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We estimated the capacities of more than 250 used nickel-cadmium(Ni/Cd)batteries with a battery checker, which we have developed, and compared them with the measured ones to confirm the accuracy of the estimation. The error for 60% of tested batteries was within ±20%. On the other hand, less than 5% of the batteries showed large estimated capacities because they were internally short-circuited. One third of the tested batteries showed the estimated capacities less than 80% of the measured ones. It may have been caused by the too small value of internal resistance used in the equation for degradation estimation. Our battery checker would be more reliable for battery degradation estimation with an improved equation for estimation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Battery checker / Ni/Cd battery / Battery degradation estimation / Cordless telephone / Internal short circuit
Paper # EE2000-52,CPM2000-156
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Conference Information
Committee EE
Conference Date 2001/1/9(1days)
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Paper Information
Registration To Energy Engineering in Electronics and Communications (EE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation of Nickel-Cadmium Batteries for Cordless Telephones and Reliability of a Battery Checker on Capacity Estimation
Sub Title (in English)
Keyword(1) Battery checker
Keyword(2) Ni/Cd battery
Keyword(3) Battery degradation estimation
Keyword(4) Cordless telephone
Keyword(5) Internal short circuit
1st Author's Name Akira Yamashita
1st Author's Affiliation NTT Telecommunications Energy Laboratories()
2nd Author's Name Toshiro Hirai
2nd Author's Affiliation NTT Telecommunications Energy Laboratories
3rd Author's Name Masayasu Arakawa
3rd Author's Affiliation NTT Telecommunications Energy Laboratories
Date 2001/1/9
Paper # EE2000-52,CPM2000-156
Volume (vol) vol.100
Number (no) 545
Page pp.pp.-
#Pages 7
Date of Issue