Presentation 2002/1/17
Near-Infrared Intersubband Absorption in MBE-Grown GaN/AlN Multiple Quantum Wells
Nobuo SUZUKI, Norio IIZUKA, Kei KANEKO,
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Abstract(in English) The intersubband transition (ISBT) in GaN is expected to be applicable to ultrafast optical devices. By adopting MBE growth and AlN barrier layers. the intersubband absorption in the optical communication wavelength range has been realized. The absorption spectra with a peak wavelength of 1.3-1.5μm were composed of three Lorentzian components representing ± 1-monolayer thickness variation. The FWHM of the spectral components was 80-100 meV.The ISBT wavelengths were strongly affected by the electric field (≥5 MV/cm) caused by the piezoelectric effect and the spontancous polarization. The measured wavelengths fit well to the theoretical values calculated assuming the field sharing model (a zero-potential drop across one period of the quantum well) and ± 1-monolayer graded regions at each hetero interface.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) optical switches / quantum wells / intersubband transition / piezoelectric effect / GaN
Paper # 2001-PS-85,2001-OFT-82,2001-OPE-126,2001-LQE-112
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Committee OFT
Conference Date 2002/1/17(1days)
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Registration To Optical Fiber Technology (OFT)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Near-Infrared Intersubband Absorption in MBE-Grown GaN/AlN Multiple Quantum Wells
Sub Title (in English)
Keyword(1) optical switches
Keyword(2) quantum wells
Keyword(3) intersubband transition
Keyword(4) piezoelectric effect
Keyword(5) GaN
1st Author's Name Nobuo SUZUKI
1st Author's Affiliation Advanced Discrete Semiconductor Technology Lab., Corporate R & D Center, Toshiba Corp.()
2nd Author's Name Norio IIZUKA
2nd Author's Affiliation Advanced Discrete Semiconductor Technology Lab., Corporate R & D Center, Toshiba Corp.
3rd Author's Name Kei KANEKO
3rd Author's Affiliation Advanced Discrete Semiconductor Technology Lab., Corporate R & D Center, Toshiba Corp.
Date 2002/1/17
Paper # 2001-PS-85,2001-OFT-82,2001-OPE-126,2001-LQE-112
Volume (vol) vol.101
Number (no) 586
Page pp.pp.-
#Pages 6
Date of Issue