Presentation 2001/11/15
High power tests on micro optics component
Yasuhiro Watanabe, Tomohiko Kimura, Kanji Tanaka, Jun Yoshino,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) High power durability of passive optical components mounted in EDFA or Raman amplifier became more important. We performed high power input test by micro-optic polarization beam combiner. We confirmed that polarization beam combiners have sufficient high power durability on 3 Watt power input(at75Cdeg, 95%RH)and 6 Watt power input(at room temperature)
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Polarization beam combiner / High power durability / Raman amplifier
Paper # OFT2001-64
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Conference Information
Committee OFT
Conference Date 2001/11/15(1days)
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Registration To Optical Fiber Technology (OFT)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High power tests on micro optics component
Sub Title (in English)
Keyword(1) Polarization beam combiner
Keyword(2) High power durability
Keyword(3) Raman amplifier
1st Author's Name Yasuhiro Watanabe
1st Author's Affiliation Furukawa Electric Co., Ltd()
2nd Author's Name Tomohiko Kimura
2nd Author's Affiliation Furukawa Electric Co., Ltd
3rd Author's Name Kanji Tanaka
3rd Author's Affiliation Furukawa Electric Co., Ltd
4th Author's Name Jun Yoshino
4th Author's Affiliation Furukawa Electric Co., Ltd
Date 2001/11/15
Paper # OFT2001-64
Volume (vol) vol.101
Number (no) 454
Page pp.pp.-
#Pages 6
Date of Issue