Presentation 2001/5/11
Refractive Index Profiles Measurement in Optical Fiber Preforms
Fujio Katou, Issei Sasaki, Shingo Okazaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A novel technique for the measurement of refractive index profile in optical fiber preforms is presented. The method uses image distortion analysis for determining ray deflection, which the index profiles can be numerically converted from. A reference pattern is located behind of the sample preform and distortion in its image taken through the preform may be observed if non-uniformity exists in it. In previous report, a static angled knife-edge as reference pattern was used and then sample is restricted within axial-dependence free profiles. For applying the technique to wide range of types of preform, we introduce straight, scanning knife-edge. In order to confirm the method, we construct prototype system and operate measurement. The results show a good agreement to result obtained from fiber drawn from the preform revealing cone structure near the end of the preform.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Optical fiber preform / Index profile measurement / Scanning knife-edge method
Paper # OFT2001-10
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Conference Information
Committee OFT
Conference Date 2001/5/11(1days)
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Paper Information
Registration To Optical Fiber Technology (OFT)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Refractive Index Profiles Measurement in Optical Fiber Preforms
Sub Title (in English)
Keyword(1) Optical fiber preform
Keyword(2) Index profile measurement
Keyword(3) Scanning knife-edge method
1st Author's Name Fujio Katou
1st Author's Affiliation Hokkaido Institute of Technology()
2nd Author's Name Issei Sasaki
2nd Author's Affiliation Hokkaido Institute of Technology:Advanced Technology Inc.
3rd Author's Name Shingo Okazaki
3rd Author's Affiliation SEIKO EG&G
Date 2001/5/11
Paper # OFT2001-10
Volume (vol) vol.101
Number (no) 63
Page pp.pp.-
#Pages 6
Date of Issue