Presentation 2001/12/14
On a new network-type reliability model representing complicated failure logics / state transitions / functional relations
Hiroshi FUKUOKA,
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Abstract(in English) In this article, a new network-type reliability model called Typed State Influence Diagram (TSID) is proposed. The new model represents complicated failure logics, state transitions and functional relations. This model can "explicitly" represent relations between the states of elements, while the existing methods did not cope with this problem. For a large-scale problem, a method to analyze and, eventually, transform to a BDD(Binary Decision Diagram) model to evaluate the reliability is also proposed. Furthermore, we introduce an Integrated Analysis Environment which integrates and arranges failure information and opinions of experts to induce the reliability estimation system based op this new model.
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Keyword(in English) Typed state influence diagram / Reliability analysis system / Network model / Integrated analysis environment
Paper # R2001-32,SSS2001-27
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Conference Date 2001/12/14(1days)
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Language JPN
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Title (in English) On a new network-type reliability model representing complicated failure logics / state transitions / functional relations
Sub Title (in English)
Keyword(1) Typed state influence diagram
Keyword(2) Reliability analysis system
Keyword(3) Network model
Keyword(4) Integrated analysis environment
1st Author's Name Hiroshi FUKUOKA
1st Author's Affiliation Signalling and Telecommunications Technology Division Railway Technical Research Institute()
Date 2001/12/14
Paper # R2001-32,SSS2001-27
Volume (vol) vol.101
Number (no) 527
Page pp.pp.-
#Pages 6
Date of Issue