Presentation | 2000/8/22 SSS2000-18 Case Studies of Electronic Equipment Reliability Prediction : Comparison between MIL-HDBK-217F and Bellcore TR-332 Nobuyuki TAHARA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | MIL-HDBK-217F has been widely used not only in Japan but also around the world as the most authorized method for reliability prediction of electronic equipments. It is noted that many reliability engineers have preferred Bellcore reliability prediction method TR-332 to 217F, because the predicted values with 217F do not always reflect the values observed in the actual field. First, this report makes a comparison between the numerical values of the generic failure rate of various electronic parts based on the two reliability prediction methods. Next, it deals with the case studies of the reliability prediction for two main units of electronic private branch exchange manufactured by TOA Corporation; one is a control unit, the other a power supply unit. Finally, it compares the MTBF values of these two units calculated by 217F with those by TR-332. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Reliability Prediction / MIL-HDBK-217F / BellcoreTR-332 / Failure rate / Parts count Method / Modification by stress |
Paper # | SSS2000-18 |
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Conference Information | |
Committee | SSS |
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Conference Date | 2000/8/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Safety (SSS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | SSS2000-18 Case Studies of Electronic Equipment Reliability Prediction : Comparison between MIL-HDBK-217F and Bellcore TR-332 |
Sub Title (in English) | |
Keyword(1) | Reliability Prediction |
Keyword(2) | MIL-HDBK-217F |
Keyword(3) | BellcoreTR-332 |
Keyword(4) | Failure rate |
Keyword(5) | Parts count Method |
Keyword(6) | Modification by stress |
1st Author's Name | Nobuyuki TAHARA |
1st Author's Affiliation | TOA Corporation Quality Assurance Section Reliability Test Center() |
Date | 2000/8/22 |
Paper # | SSS2000-18 |
Volume (vol) | vol.100 |
Number (no) | 273 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |