Presentation | 2004/5/21 Development of the ion trap to measure the characteristic of the molecular ion produced by chemical reaction of Yb^+ in excited states Michihiko IKEDA, Masao KITANO, Kazuhiko SUGIYAMA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It is known the production of the molecular ion by chemical reaction of Yb^+ in excited states with residual gas. This phenomenon may be a problem in establishing optical frequency standard. On the other hand, it would be thought the new application of the characteristic measurement of a single molecular ion. We start the development of the ion trap apparatus to investigate the phenomenon. Using the apparatus, the mechanism of chemical reaction would be investigated and the reaction rate would be measured. We report the confirmation and the characteristic measurement of trapped Yb^+ by RF resonance absorption method. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | ion trap / Yb^+ / molecular ion / residual gas / RF resonance absorption method |
Paper # | LQE2004-12 |
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Conference Information | |
Committee | LQE |
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Conference Date | 2004/5/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Lasers and Quantum Electronics (LQE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Development of the ion trap to measure the characteristic of the molecular ion produced by chemical reaction of Yb^+ in excited states |
Sub Title (in English) | |
Keyword(1) | ion trap |
Keyword(2) | Yb^+ |
Keyword(3) | molecular ion |
Keyword(4) | residual gas |
Keyword(5) | RF resonance absorption method |
1st Author's Name | Michihiko IKEDA |
1st Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University() |
2nd Author's Name | Masao KITANO |
2nd Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
3rd Author's Name | Kazuhiko SUGIYAMA |
3rd Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
Date | 2004/5/21 |
Paper # | LQE2004-12 |
Volume (vol) | vol.104 |
Number (no) | 98 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |