Presentation 2004/5/21
Development of the ion trap to measure the characteristic of the molecular ion produced by chemical reaction of Yb^+ in excited states
Michihiko IKEDA, Masao KITANO, Kazuhiko SUGIYAMA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) It is known the production of the molecular ion by chemical reaction of Yb^+ in excited states with residual gas. This phenomenon may be a problem in establishing optical frequency standard. On the other hand, it would be thought the new application of the characteristic measurement of a single molecular ion. We start the development of the ion trap apparatus to investigate the phenomenon. Using the apparatus, the mechanism of chemical reaction would be investigated and the reaction rate would be measured. We report the confirmation and the characteristic measurement of trapped Yb^+ by RF resonance absorption method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) ion trap / Yb^+ / molecular ion / residual gas / RF resonance absorption method
Paper # LQE2004-12
Date of Issue

Conference Information
Committee LQE
Conference Date 2004/5/21(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of the ion trap to measure the characteristic of the molecular ion produced by chemical reaction of Yb^+ in excited states
Sub Title (in English)
Keyword(1) ion trap
Keyword(2) Yb^+
Keyword(3) molecular ion
Keyword(4) residual gas
Keyword(5) RF resonance absorption method
1st Author's Name Michihiko IKEDA
1st Author's Affiliation Department of Electronic Science and Engineering, Kyoto University()
2nd Author's Name Masao KITANO
2nd Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
3rd Author's Name Kazuhiko SUGIYAMA
3rd Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
Date 2004/5/21
Paper # LQE2004-12
Volume (vol) vol.104
Number (no) 98
Page pp.pp.-
#Pages 4
Date of Issue