| Presentation | 2002/11/7 A Bit-Error Rate Analysis based on Photoelectron Statistics for Lightwave Systems corrupted by Optical Amplifier Noise Hifumi NOTO, Mayumi ABE, Yoshiaki YAMAGUCHI, Takayuki YOSHINO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The aim of this paper is to present a theoretical investigation on bit-error rates (BER) of lightwave systems employing optical amplifiers. An analysis based on photoelectron statistics makes it possible to find the probability density function (PDF) accurately that includes influence of the bandpass profile of optical filters. The PDF for photoelectron counts is correctly calculated by expanding the light amplitude in terms of orthogonal basis functions. The BERs are calculated from the exact PDF of photoelectrons when a laser beam is corrupted by optical amplifier noise. In addition, we discuss the accuracy of approximate formulae that are widely used for BER calculations by comparing with our exact results. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | optical amplifier / photoelectron statistics / optical receiver / bit-error rate |
| Paper # | LQE2002-137 |
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| Conference Information | |
| Committee | LQE |
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| Conference Date | 2002/11/7(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Lasers and Quantum Electronics (LQE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Bit-Error Rate Analysis based on Photoelectron Statistics for Lightwave Systems corrupted by Optical Amplifier Noise |
| Sub Title (in English) | |
| Keyword(1) | optical amplifier |
| Keyword(2) | photoelectron statistics |
| Keyword(3) | optical receiver |
| Keyword(4) | bit-error rate |
| 1st Author's Name | Hifumi NOTO |
| 1st Author's Affiliation | School of Engineering, Tokyo Denki University() |
| 2nd Author's Name | Mayumi ABE |
| 2nd Author's Affiliation | School of Engineering, Tokyo Denki University |
| 3rd Author's Name | Yoshiaki YAMAGUCHI |
| 3rd Author's Affiliation | Nippon Institute of Technology |
| 4th Author's Name | Takayuki YOSHINO |
| 4th Author's Affiliation | School of Engineering, Tokyo Denki University |
| Date | 2002/11/7 |
| Paper # | LQE2002-137 |
| Volume (vol) | vol.102 |
| Number (no) | 450 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |