Presentation | 2002/6/8 Structural Defects in GaN-based Semiconductor Laser Diodes Shigetaka Tomiya, Tomonori Hino, Takao Miyajima, Motonobu Takeya, Masao Ikeda, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have investigated dislocations in GaN-based laser diodes (LDs) on epitaxial lateral overgrown (ELO) GaN layers using transmission electron microscopy and cathodoluminescnce microscopy and found a correlation between dislocations and device reliability. The origin of dislocations in the wing regions of ELO structures is the extension of defects in highly defective regions near the GaN layer/substrate interface of the seed regions. In some LDs with a short lifetime, dislocations lying in the c-plane were formed below the active regions, bent towards the c-axis and threaded upwards to active regions. These newly created dislocations can cause to be detrimental to the device lifetime. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | GaN-based Laser Diode / ELO / Dislocations / Transmission Electron Microscopy / Cathodoluminescence |
Paper # | LQE2002-89 |
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Conference Information | |
Committee | LQE |
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Conference Date | 2002/6/8(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Lasers and Quantum Electronics (LQE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Structural Defects in GaN-based Semiconductor Laser Diodes |
Sub Title (in English) | |
Keyword(1) | GaN-based Laser Diode |
Keyword(2) | ELO |
Keyword(3) | Dislocations |
Keyword(4) | Transmission Electron Microscopy |
Keyword(5) | Cathodoluminescence |
1st Author's Name | Shigetaka Tomiya |
1st Author's Affiliation | Technical Solutions Center, Sony Corp.() |
2nd Author's Name | Tomonori Hino |
2nd Author's Affiliation | Core Technology Network Company, Sony Corp. |
3rd Author's Name | Takao Miyajima |
3rd Author's Affiliation | Core Technology Network Company, Sony Corp. |
4th Author's Name | Motonobu Takeya |
4th Author's Affiliation | Sony Shiroishi Semiconductor, Inc. |
5th Author's Name | Masao Ikeda |
5th Author's Affiliation | Sony Shiroishi Semiconductor, Inc. |
Date | 2002/6/8 |
Paper # | LQE2002-89 |
Volume (vol) | vol.102 |
Number (no) | 119 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |