Presentation 2002/6/6
High Quality GaN Grown by Raised-Pressure HVPE
Shinya BOHYAMA, Kenji YOSHIKAWA, Hiroyuki NAOI, Hideto MIYAKE, Kazumasa HIRAMATSU, Yasushi IYECHIKA, Takayosi MAEDA,
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Abstract(in English) Reactor pressure is an important factor in HVPE growth process. HVPE of GaN has been performed at atmospheric pressure, the pressure effects has hardly been investigated. We investigated an effect of reactor pressure. For growth at 0.4 and 1 atm, several cracks are observed in the surface and the FWHM values in (0004) and (1010) X-ray rocking curves (XRCs) are larger than 350 arcsec. These values were broader than those of the underlying GaN layers. However, for growth at 1.2 atm, crack-free GaN films are obtained and the FWHMs in both (0004) and (1010) XRC are dramatically reduced to narrower than 190 arcsec.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) GaN / Raised-Pressure HVPE
Paper # LQE2002-29
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Committee LQE
Conference Date 2002/6/6(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High Quality GaN Grown by Raised-Pressure HVPE
Sub Title (in English)
Keyword(1) GaN
Keyword(2) Raised-Pressure HVPE
1st Author's Name Shinya BOHYAMA
1st Author's Affiliation Faculty of Engineering, Mie University()
2nd Author's Name Kenji YOSHIKAWA
2nd Author's Affiliation Faculty of Engineering, Mie University
3rd Author's Name Hiroyuki NAOI
3rd Author's Affiliation Satellite Venture Business Laboratory, Mie University
4th Author's Name Hideto MIYAKE
4th Author's Affiliation Faculty of Engineering, Mie University
5th Author's Name Kazumasa HIRAMATSU
5th Author's Affiliation Faculty of Engineering, Mie University
6th Author's Name Yasushi IYECHIKA
6th Author's Affiliation Tsukuba Research Laboratory, Sumitomo Chemical Co., Ltd.
7th Author's Name Takayosi MAEDA
7th Author's Affiliation Tsukuba Research Laboratory, Sumitomo Chemical Co., Ltd.
Date 2002/6/6
Paper # LQE2002-29
Volume (vol) vol.102
Number (no) 117
Page pp.pp.-
#Pages 4
Date of Issue