Presentation 2002/6/6
Epitaxial Growth of III-Nitrides with Low Dislocations
H. Miyake, R. Takeuchi, K. Hiramatsu, H. Naoi, Y. Iyechika, T. Maeda, T. Riemann, F. Bertram, J. Christen,
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Abstract(in English) Epitaxial lateral overgrowth(ELO)is a promising technique to obtain a high-quality epitaxial GaN layer with low threading dislocation(TD)density. We reported facet controlled ELO(FACELO)technique of GaN was a usefultechnique to reduce TD density and achieved TD density of the order of 10^6cm^-2 in 10 μm thick ELO. Thickness of the ELOlayer for obtaining flat surface is dependent on window and mask widths, but the most suitable widths of ELO window andmask are not clear. In this work, we investigated density and distribution of TDs in the FACELO GaN with different window and mask widthsand obtained GaN with TD density of the order of 10^5cm^-2 except in coalescence region. Effects of facet structure during theELO process on the crystalline and optical properties of GaN are discussed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) GaN / epitaxial lateral overgrowth(ELO) / threading dislocation / facet controlled ELO(FACELO) / CL
Paper # LQE2002-28
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Committee LQE
Conference Date 2002/6/6(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Epitaxial Growth of III-Nitrides with Low Dislocations
Sub Title (in English)
Keyword(1) GaN
Keyword(2) epitaxial lateral overgrowth(ELO)
Keyword(3) threading dislocation
Keyword(4) facet controlled ELO(FACELO)
Keyword(5) CL
1st Author's Name H. Miyake
1st Author's Affiliation Dept. of Electrical and Electronic Engineering,Mie Univ.()
2nd Author's Name R. Takeuchi
2nd Author's Affiliation Dept. of Electrical and Electronic Engineering,Mie Univ.
3rd Author's Name K. Hiramatsu
3rd Author's Affiliation Dept. of Electrical and Electronic Engineering,Mie Univ.
4th Author's Name H. Naoi
4th Author's Affiliation Satellite Venture Business Laboratory,Mie Univ.
5th Author's Name Y. Iyechika
5th Author's Affiliation Tsukuba Research Laboratory,Sumitomo Chemical Co.,Ltd
6th Author's Name T. Maeda
6th Author's Affiliation Tsukuba Research Laboratory,Sumitomo Chemical Co.,Ltd
7th Author's Name T. Riemann
7th Author's Affiliation Institute of Experimental Physics,Otto-von-Guericke-University Magdeburg
8th Author's Name F. Bertram
8th Author's Affiliation Institute of Experimental Physics,Otto-von-Guericke-University Magdeburg
9th Author's Name J. Christen
9th Author's Affiliation Institute of Experimental Physics,Otto-von-Guericke-University Magdeburg
Date 2002/6/6
Paper # LQE2002-28
Volume (vol) vol.102
Number (no) 117
Page pp.pp.-
#Pages 4
Date of Issue