Presentation 2002/6/6
Study on Stress Distributions in Air-Bridged Lateral Epitaxial Grown GaN with Low Dislocation Density
Akihiko ISHIBASHI, Gaku SUGAHARA, Yasutoshi KAWAGUCHI, Toshiya YOKOGAWA,
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Abstract(in English) The deformations and the stress distributions in air-bridged lateral epitaxial grown (ABLEG) GaN films with low dislocation densities have been studied by atomic force microscopy (AFM), finite element method (FEM) analysis, and micro-Raman spectroscopy. The wing regions of the ABLEG-GaN films slightly tilt, and the direction of the wing tilt changes with coalescence of the wings. After coalescence of the wings, the tilt angle decreases with increase of the film thickness. By FEM analysis and Raman spectroscopy, it has been found that the deformation of the wings originates from the distributions of the thermal stress due to large mismatch of the thermal expansion coefficient (α_GaN<α_sapphire).
Keyword(in Japanese) (See Japanese page)
Keyword(in English) GaN / air-bridge / dislocation / thermal stress distribution / micro-Raman
Paper # LQE2002-21
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Committee LQE
Conference Date 2002/6/6(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on Stress Distributions in Air-Bridged Lateral Epitaxial Grown GaN with Low Dislocation Density
Sub Title (in English)
Keyword(1) GaN
Keyword(2) air-bridge
Keyword(3) dislocation
Keyword(4) thermal stress distribution
Keyword(5) micro-Raman
1st Author's Name Akihiko ISHIBASHI
1st Author's Affiliation Advanced Technology Research Laboratories, Matsushita Electric Industrial Co., Ltd.()
2nd Author's Name Gaku SUGAHARA
2nd Author's Affiliation Advanced Technology Research Laboratories, Matsushita Electric Industrial Co., Ltd.
3rd Author's Name Yasutoshi KAWAGUCHI
3rd Author's Affiliation Advanced Technology Research Laboratories, Matsushita Electric Industrial Co., Ltd.
4th Author's Name Toshiya YOKOGAWA
4th Author's Affiliation Advanced Technology Research Laboratories, Matsushita Electric Industrial Co., Ltd.
Date 2002/6/6
Paper # LQE2002-21
Volume (vol) vol.102
Number (no) 117
Page pp.pp.-
#Pages 4
Date of Issue