| Presentation | 2004/4/16 Facet degradation behavior of InGaAs/GaAs strained-layer quantum-well lasers Tatsuya TAKESHITA, Mitsuru SUGO, Yuichi TOHMORI, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Facet degradation mechanisms of a 980-nm InGaAs/GaAs strained-layer quantum-well laser are analyzed by monitoring the optical-beam induced current. Sudden failure during aging is due to catastrophic optical damage. It is clarified that the behavior of defects around the facets governs the long-term stability as well as catastrophic-optical damage generation during operation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Semiconductor laser / Laser reliability / Aging / Facet degradation / Optical beam induced current / OBIC |
| Paper # | R2004-6,CPM2004-6,OPE2004-6 |
| Date of Issue |
| Conference Information | |
| Committee | OPE |
|---|---|
| Conference Date | 2004/4/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Optoelectronics (OPE) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Facet degradation behavior of InGaAs/GaAs strained-layer quantum-well lasers |
| Sub Title (in English) | |
| Keyword(1) | Semiconductor laser |
| Keyword(2) | Laser reliability |
| Keyword(3) | Aging |
| Keyword(4) | Facet degradation |
| Keyword(5) | Optical beam induced current |
| Keyword(6) | OBIC |
| 1st Author's Name | Tatsuya TAKESHITA |
| 1st Author's Affiliation | NTT Photonics Laboratories, NTT Corporation() |
| 2nd Author's Name | Mitsuru SUGO |
| 2nd Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| 3rd Author's Name | Yuichi TOHMORI |
| 3rd Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| Date | 2004/4/16 |
| Paper # | R2004-6,CPM2004-6,OPE2004-6 |
| Volume (vol) | vol.104 |
| Number (no) | 28 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |