Presentation 2004/4/16
Reliability of Optical Device and Module in Optical Communication
Seiko MITACHI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) I will introduce the methodology of the estimation of the failure rate of optical passive devices based on EEC62005 international standard and an example of failure rate estimation on optical splitters. I will also discuss the relation between failure mechanism of optical devices and the reliability parameters of optical adhesive measured by accelerated degradation test.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Optical passive device / reliability / life time / failure rate / failure mechanism / optical adhesive
Paper # R2004-4,CPM2004-4,OPE2004-4
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Conference Information
Committee OPE
Conference Date 2004/4/16(1days)
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Paper Information
Registration To Optoelectronics (OPE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Reliability of Optical Device and Module in Optical Communication
Sub Title (in English)
Keyword(1) Optical passive device
Keyword(2) reliability
Keyword(3) life time
Keyword(4) failure rate
Keyword(5) failure mechanism
Keyword(6) optical adhesive
1st Author's Name Seiko MITACHI
1st Author's Affiliation Tokyo University of Technology()
Date 2004/4/16
Paper # R2004-4,CPM2004-4,OPE2004-4
Volume (vol) vol.104
Number (no) 28
Page pp.pp.-
#Pages 6
Date of Issue