| Presentation | 2004/5/14 HAST Test of PCB for TEL/LAN Connector Kouji AITA, Seiichi ONODA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | When a newly developed TEL/LAN Rosette is used for the ISDN or Home Telephone System, considerably high DC voltage is happened to be applied to specific terminals of the rosette. In these situations, a kind of migration may be occurred, which spoils the insulation between strip lines on the circuit board connecting jack and clump terminals. In order to verify the reliability of the rosette, 200 hours of HAST test has been done for the circuit board under the application of DC voltage. As a result, very little changes in the insulation resistance were found. Considerations on the relation between resistance changes and the separation of the strip lines, as well as the observations of the color changes around the strip lines after the HAST stresses, show that migration does not occur and the rosette is sufficiently reliable. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Telephone / LAN / Rosette / Printed Circuit Board / Pressure Cooker / HAST / Migration |
| Paper # | EMD2004-7 |
| Date of Issue |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 2004/5/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | HAST Test of PCB for TEL/LAN Connector |
| Sub Title (in English) | |
| Keyword(1) | Telephone |
| Keyword(2) | LAN |
| Keyword(3) | Rosette |
| Keyword(4) | Printed Circuit Board |
| Keyword(5) | Pressure Cooker |
| Keyword(6) | HAST |
| Keyword(7) | Migration |
| 1st Author's Name | Kouji AITA |
| 1st Author's Affiliation | Watanabe Co.,Ltd.() |
| 2nd Author's Name | Seiichi ONODA |
| 2nd Author's Affiliation | Watanabe Co.,Ltd. |
| Date | 2004/5/14 |
| Paper # | EMD2004-7 |
| Volume (vol) | vol.104 |
| Number (no) | 74 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |