| Presentation | 2003/11/14 Testing Method Study of Contact Resistance Behavior on Contaminated Contact Area (Session 6 : Contact Phenomena (2)) Cui-Feng Feng, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Nowadays electronic connectors are widely used in various telecommunication devices. These connectors are easily contaminated because the devices are usually exposed in air. In this paper, the contact resistance behavior on contaminated connector contacts is discussed. In order to evaluate the contact reliability of the contaminated contact, multiple-point test is required in the contact resistance measurement. The results show that the contaminated contact area is a hazard to the reliability of the connector. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Contaminant / Contact resistance / Contact failure |
| Paper # | EMD2003-85 |
| Date of Issue |
| Conference Information | |
| Committee | EMD |
|---|---|
| Conference Date | 2003/11/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
|---|---|
| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Testing Method Study of Contact Resistance Behavior on Contaminated Contact Area (Session 6 : Contact Phenomena (2)) |
| Sub Title (in English) | |
| Keyword(1) | Contaminant |
| Keyword(2) | Contact resistance |
| Keyword(3) | Contact failure |
| 1st Author's Name | Cui-Feng Feng |
| 1st Author's Affiliation | Research Lab of Electric Contacts, Beijing University() |
| Date | 2003/11/14 |
| Paper # | EMD2003-85 |
| Volume (vol) | vol.103 |
| Number (no) | 449 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |