| Presentation | 2002/12/13 Effects of surface topography measurement conditions on AFM-based nanowear tests Yoshihiko OHKUBO, Shinsuke MATSUHASHI, Hisayoshi TAZIMA, Shigeru UMEMURA, Shigeru HIRONO, Reizo KANEKO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Nanowear test based on AFM technique has been applied for the evaluation of wear durability characteristics of various materials and adhesion characteristics of ultrathin films. However, motion of wear debris during the nanowear tests and effects of wear debris on topography measurement tests have not been well clarified. To clarify these items, we have observed the scratched surface by the tapping mode and the contact mode at a low load condition in AFM. We have found that the motion of the wear debris was significantly affected by the observation modes and the topography of measurement results the scratched area were altered by the presence of the wear debris. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Wear / Nanowear / Scratch / Wear debris / Surface / AFM |
| Paper # | EMD2002-93 |
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| Conference Information | |
| Committee | EMD |
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| Conference Date | 2002/12/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Effects of surface topography measurement conditions on AFM-based nanowear tests |
| Sub Title (in English) | |
| Keyword(1) | Wear |
| Keyword(2) | Nanowear |
| Keyword(3) | Scratch |
| Keyword(4) | Wear debris |
| Keyword(5) | Surface |
| Keyword(6) | AFM |
| 1st Author's Name | Yoshihiko OHKUBO |
| 1st Author's Affiliation | Faculty of Engineering, Chiba Institute of Technology() |
| 2nd Author's Name | Shinsuke MATSUHASHI |
| 2nd Author's Affiliation | Faculty of Engineering, Chiba Institute of Technology |
| 3rd Author's Name | Hisayoshi TAZIMA |
| 3rd Author's Affiliation | Faculty of Engineering, Chiba Institute of Technology |
| 4th Author's Name | Shigeru UMEMURA |
| 4th Author's Affiliation | Faculty of Engineering, Chiba Institute of Technology |
| 5th Author's Name | Shigeru HIRONO |
| 5th Author's Affiliation | NTT AFTY Corporation |
| 6th Author's Name | Reizo KANEKO |
| 6th Author's Affiliation | Faculty of Systems Engineering, Wakayama University |
| Date | 2002/12/13 |
| Paper # | EMD2002-93 |
| Volume (vol) | vol.102 |
| Number (no) | 539 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |