Presentation 2004-07-21
A Study on the DFT Test in NIST SP800-22
Hisashi YAMAMOTO, Toshinobu KANEKO,
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Abstract(in English) The Discrete Fourier Transform Test is one of sixteen randomness tests in NIST SP800-22. The purpose of this test is to evaluate the input sequence on the basis of randomness in the sequence, which binarize frequency components by a threshold value. Hamano et al. pointed out that the empirical variance of the binarized sequence is decreased to approximately 50 % of the theoretical value. In this paper, we claim that the decrease is due to the energy restriction of frequency components by Perseval's theorem. And the ratio of the variance depends on the threshold value.
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Keyword(in English) Random Numbers / Randomness / Discrete Fourier Transform Test / Parseval's Theorem
Paper # ISEC2004-50
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Committee ISEC
Conference Date 2004/7/14(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on the DFT Test in NIST SP800-22
Sub Title (in English)
Keyword(1) Random Numbers
Keyword(2) Randomness
Keyword(3) Discrete Fourier Transform Test
Keyword(4) Parseval's Theorem
1st Author's Name Hisashi YAMAMOTO
1st Author's Affiliation Graduate School of Science and Technology, Tokyo University of Science()
2nd Author's Name Toshinobu KANEKO
2nd Author's Affiliation Faculty of Science and Tehnology, Tokyo University of Science
Date 2004-07-21
Paper # ISEC2004-50
Volume (vol) vol.104
Number (no) 200
Page pp.pp.-
#Pages 4
Date of Issue