Presentation 2002/11/8
A Study on Strength of Pseudorandom Number Generator MUGI against Truncate Linear Attack
Hiroki SEIKINE, Tetsuro NOSAKA, Yasuo HATANO, Masaki TAKEDA, Toshinobu KANEKO,
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Abstract(in English) MUGI which is proposed by Hitachi,Ltd in 2001 is a pseudorandom number generator for a stream cipher, and its structure is composed of a linear process and a non-linear process. For such a structure, D .coppersmith et.al. have shown a method which distinguishes between an output sequence from the stream cipher and a truly random sequence in "Cryptanalysis of stream ciphers with linear masking". In this paper, we will apply the method to MUGI, and evaluate its strength against Linear Attack. For the analysis, we regard a linear process as a linear dynamic system, and adopt a linear approximation for a non-linear process as a distinguisher. We estimate the upper bound of maximum linear characteristic probability on MUGI by 64bit truncate linear cryptanalysis. As a result, the probability on MUGI is less than 2^-138. Therefore, MUGI is secure against Linear Attack.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MUGI / Stream ciphers / Truncate linear cryptanalysis / Linear dynamic system / Distinguisher / Maximum linear characteristic probability
Paper # ISEC2002-92
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Committee ISEC
Conference Date 2002/11/8(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on Strength of Pseudorandom Number Generator MUGI against Truncate Linear Attack
Sub Title (in English)
Keyword(1) MUGI
Keyword(2) Stream ciphers
Keyword(3) Truncate linear cryptanalysis
Keyword(4) Linear dynamic system
Keyword(5) Distinguisher
Keyword(6) Maximum linear characteristic probability
1st Author's Name Hiroki SEIKINE
1st Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science()
2nd Author's Name Tetsuro NOSAKA
2nd Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science
3rd Author's Name Yasuo HATANO
3rd Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science
4th Author's Name Masaki TAKEDA
4th Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science
5th Author's Name Toshinobu KANEKO
5th Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science
Date 2002/11/8
Paper # ISEC2002-92
Volume (vol) vol.102
Number (no) 437
Page pp.pp.-
#Pages 8
Date of Issue