Presentation 2002/11/8
Study on FRR and FAR of DNA Biometrics Authentication System using by DNA Personal ID
Toshio NAGASHIMA, Eiji MUTO, Yukio ITAKURA, Masaki HASHIYADA, Shigeo TSUJII,
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Abstract(in English) There are two measures, FAR (False Acceptance Rate) and FRR (False Rejection Rate) to evaluate the characteristic of Biometrics Authentication systems. We investigate the FAR and FRR using by an ordinary definition of the degree of similarity, that is like a hamming distance, as is introduced in the code of iris. In this investigation, we adopt the registered data of 508 real sampling data and the numerically simulated data of 10,000 registering data and another 10,000 verifying data. We also discuss about the statistical limits of the sampling number in FRR and FAR of DNA personal ID.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) DNA biometrics personal authentication system / DNA personal ID / FRR / FAR / hamming distance / similarity
Paper # ISEC2002-85
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Committee ISEC
Conference Date 2002/11/8(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on FRR and FAR of DNA Biometrics Authentication System using by DNA Personal ID
Sub Title (in English)
Keyword(1) DNA biometrics personal authentication system
Keyword(2) DNA personal ID
Keyword(3) FRR
Keyword(4) FAR
Keyword(5) hamming distance
Keyword(6) similarity
1st Author's Name Toshio NAGASHIMA
1st Author's Affiliation NTT DATA Technology corporation()
2nd Author's Name Eiji MUTO
2nd Author's Affiliation NTT DATA Technology corporation
3rd Author's Name Yukio ITAKURA
3rd Author's Affiliation NTT DATA Technology corporation:Chuo University, Research and Development Initiative
4th Author's Name Masaki HASHIYADA
4th Author's Affiliation Tohoku University, Graduate Medical Research Department
5th Author's Name Shigeo TSUJII
5th Author's Affiliation Chuo University, Research and Development Initiative
Date 2002/11/8
Paper # ISEC2002-85
Volume (vol) vol.102
Number (no) 437
Page pp.pp.-
#Pages 7
Date of Issue