Presentation 2002/6/17
Analysis of LSI Circuits Coupled with RCG Interconnects : Asymptotic Method
Hideo SAKAGUCHI, Yoshihiro YAMAGAMI, Yoshihumi NISHIO, Atsumi HATTORI, Akio USHIDA,
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Abstract(in English) High frequency digital LSI circuits are usually composed of many sub-circuits coupled with interconnects. They sometimes causes serious problems of the fault switching by time-delays, crosstalks, reflections of signals and so on. Therefore, it is very important to develop a user-friendly simulator for solving these problems. Although a moment matching method is widely used as the reduction technique of interconnects, it sometimes happens to arise erroneous results for evaluating of the poles far from the origin in complex plane. In this paper, we show an asymptotic method in the complex frequency-domain, where we calculate the exact poles and residues giving large effect to the transient responses. Then, the interconnects are replaced by the asymptotic equivalent circuits using the poles and residues. Thus, we can develop a users-friendly simulator using the equivalent circuits.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) RCG interconnect / substrate RC circuit / asymptotic equivalent circuit / SPICE simulation / partial fractions / LSI circuits
Paper # NLP2002-10
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Committee NLP
Conference Date 2002/6/17(1days)
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Paper Information
Registration To Nonlinear Problems (NLP)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of LSI Circuits Coupled with RCG Interconnects : Asymptotic Method
Sub Title (in English)
Keyword(1) RCG interconnect
Keyword(2) substrate RC circuit
Keyword(3) asymptotic equivalent circuit
Keyword(4) SPICE simulation
Keyword(5) partial fractions
Keyword(6) LSI circuits
1st Author's Name Hideo SAKAGUCHI
1st Author's Affiliation Dept. of Electrical and Electronic Engineering, Tokushima University()
2nd Author's Name Yoshihiro YAMAGAMI
2nd Author's Affiliation Dept. of Electrical and Electronic Engineering, Tokushima University
3rd Author's Name Yoshihumi NISHIO
3rd Author's Affiliation Dept. of Electrical and Electronic Engineering, Tokushima University
4th Author's Name Atsumi HATTORI
4th Author's Affiliation Dept. of Electrical and Electronic Engineering, Tokushima University
5th Author's Name Akio USHIDA
5th Author's Affiliation Dept. of Electrical and Electronic Engineering, Tokushima University
Date 2002/6/17
Paper # NLP2002-10
Volume (vol) vol.102
Number (no) 141
Page pp.pp.-
#Pages 7
Date of Issue