Presentation | 2003/4/18 Behavior of Z-Cut Quartz Etalon for Wavelength Locker : Analysis and Experiments of direct cavity modulation of Etalon Shigeru Ohshima, Masahide Miyachi, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The temperature coefficient of the Z-cut quartz etalon that can be used for a wavelength locker of an LD module is only 500 MHz/℃. Since the cavity length of the Z-cut quartz etalons can directly be modulated by the electric field of the X-direction, the LD wavelength can be detected by the synchronous detection without DC drift. This paper presents an analysis of the cavity length modulation of a Z-cut quartz etalon for LD wavelength lockers. The electro-optic effect, piezoelectric effect, photo-elastic effect and a mechanical circuit of the etalon with a weight were considered. We also show that the experimental values were in accord with the calculated values. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | WDM / Wavelength Locker / Optical Frequency / stability / Etalon / Fabry-Perot / Quartz / Synchronous Detection |
Paper # | OCS2003-4 |
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Conference Information | |
Committee | OCS |
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Conference Date | 2003/4/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Optical Communication Systems (OCS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Behavior of Z-Cut Quartz Etalon for Wavelength Locker : Analysis and Experiments of direct cavity modulation of Etalon |
Sub Title (in English) | |
Keyword(1) | WDM |
Keyword(2) | Wavelength Locker |
Keyword(3) | Optical Frequency |
Keyword(4) | stability |
Keyword(5) | Etalon |
Keyword(6) | Fabry-Perot |
Keyword(7) | Quartz |
Keyword(8) | Synchronous Detection |
1st Author's Name | Shigeru Ohshima |
1st Author's Affiliation | Research Development Center, Toshiba Corporation() |
2nd Author's Name | Masahide Miyachi |
2nd Author's Affiliation | Research Development Center, Toshiba Corporation |
Date | 2003/4/18 |
Paper # | OCS2003-4 |
Volume (vol) | vol.103 |
Number (no) | 30 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |