| Presentation | 2003/1/20 Influence of remaining moisture atmosphere in growth chamber on luminescent characteristics of SrS:Ce TFEL devices Takahiro KIMURA, Hidekazu OKA, Kousuke TAKASU, Haruki FUKADA, Koutoku OHMI, Shosaku TANAKA, Hiroshi KOBAYASHI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | SrS : Ce transparent thin film electroluminescent (EL) devices having a glass substrate and both-sides transparent ITO electrodes have been prepared by electron beam evaporation method. Ce^<3+> luminescence easily changed by deposition methods and conditions and has not been reproduced yet. In this study, we made efforts to reproduce bluish-green Ce^<3+> luminescence. The relation between Ce^<3+> luminescence and deposition atmosphere was investigated using a QMS(quadrupole mass spectroscopy) measurement. Bluish-green consistent Ce^<3+> luminescence with higher luminance and efficiency can be achieved for the SrS:Ce TFEL devices prepared in the atmosphere of both proper moisture atmosphere and excess sulfur supply. Maximum luminance, efficiency and CIE color coordinate are 340 cd/m_2, 0.15 lm/W and (0.18, 0.33), respectively. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | SrS:Ce / transparent TFEL devices / electron beam evaporation / H_2S supply / QMS measurement |
| Paper # | EID20002-93 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 2003/1/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Influence of remaining moisture atmosphere in growth chamber on luminescent characteristics of SrS:Ce TFEL devices |
| Sub Title (in English) | |
| Keyword(1) | SrS:Ce |
| Keyword(2) | transparent TFEL devices |
| Keyword(3) | electron beam evaporation |
| Keyword(4) | H_2S supply |
| Keyword(5) | QMS measurement |
| 1st Author's Name | Takahiro KIMURA |
| 1st Author's Affiliation | Dept.Electrical and Electronic Eng.,Tottori Univ.() |
| 2nd Author's Name | Hidekazu OKA |
| 2nd Author's Affiliation | Dept.Electrical and Electronic Eng.,Tottori Univ. |
| 3rd Author's Name | Kousuke TAKASU |
| 3rd Author's Affiliation | Dept.Electrical and Electronic Eng.,Tottori Univ. |
| 4th Author's Name | Haruki FUKADA |
| 4th Author's Affiliation | Venture business laboratory Shizuoka Univ. |
| 5th Author's Name | Koutoku OHMI |
| 5th Author's Affiliation | Dept.Electrical and Electronic Eng.,Tottori Univ. |
| 6th Author's Name | Shosaku TANAKA |
| 6th Author's Affiliation | Dept.Electrical and Electronic Eng.,Tottori Univ. |
| 7th Author's Name | Hiroshi KOBAYASHI |
| 7th Author's Affiliation | Dept.Electrical and Electronic Eng.,Tottori Univ. |
| Date | 2003/1/20 |
| Paper # | EID20002-93 |
| Volume (vol) | vol.102 |
| Number (no) | 600 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |