| Presentation | 2003/1/20 Effects of Gd Doping on Luminescence Properties of SrIn_2O_4:Pr^<3+>, a Phosphor for Low-energy Electron Excitation Manabu OGURA, Akira YAMAMOTO, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Some III-group impurities, e.g. Al^<3+>, B^<3+>, Sc^<3+>, Y^<3+> or Gd^<3+>, added to a red phosphor SrIn_2O_4:Pr^<3+> for low-energy electron excitation, improve luminescence efficiency, while another impurity, La3+ decreases efficiency. This work investigates the mechanism of this impurity effect, particularly the difference between Gd^<3+> and La^<3+> in improving efficiency. The sites where these ions replace in SrIn_2O_4 lattice are discussed with powder X-ray diffraction and luminescence spectra measurements. The impurity effect on luminescence efficiency is discussed based on a following model; III-group impurities substituting In^<3+> site improve the luminescence efficiency of Pr^<3+> by capturing electrons in competition with oxygen ion vacancies, which work as nonradiative centers at higher temperature. In contrast III-group impurities substituting Sr^<2+> site decreases efficiency by increasing oxygen ion vacancies. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Low-energy electron phosphors / rare earth impurities / luminescence efficiency / trap levels |
| Paper # | EID20002-90 |
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| Committee | EID |
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| Conference Date | 2003/1/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Effects of Gd Doping on Luminescence Properties of SrIn_2O_4:Pr^<3+>, a Phosphor for Low-energy Electron Excitation |
| Sub Title (in English) | |
| Keyword(1) | Low-energy electron phosphors |
| Keyword(2) | rare earth impurities |
| Keyword(3) | luminescence efficiency |
| Keyword(4) | trap levels |
| 1st Author's Name | Manabu OGURA |
| 1st Author's Affiliation | Tokyo University of Technology() |
| 2nd Author's Name | Akira YAMAMOTO |
| 2nd Author's Affiliation | Tokyo University of Technology |
| Date | 2003/1/20 |
| Paper # | EID20002-90 |
| Volume (vol) | vol.102 |
| Number (no) | 600 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |