| Presentation | 2002/6/10 Ion-Induced Secondary Electron Emission Characteristics of Compound Oxide Materials : Circuit Design of Automatic Measuring Systems for Secondary Electron Emission Characteristics of Protecting Materials S. Goto, T. Hirakawa, H. Uchiike, Shoshu Chou, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Ion-induced secondary electron emission characteristics (γ_i). is very most important to evaluate protecting material for ac-Plasma Display. Automatic measuring system results in the repeatable result with stability, and expected to have new information about the protecting materials by the detailed analysis for the obtained results. In the present paper, we tried to make the measuring system, which is controlled by the personal computer. We examined the point on mounting, and designed nano-current circuit, which consist of I-V conversion circuit and isolation amplifier. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Secondary Electron Emission Characteristics by Ion Bombardment / Automatic Measurement System / Nano-current Measurement / Protecting Layer |
| Paper # | EID2002-4 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 2002/6/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Ion-Induced Secondary Electron Emission Characteristics of Compound Oxide Materials : Circuit Design of Automatic Measuring Systems for Secondary Electron Emission Characteristics of Protecting Materials |
| Sub Title (in English) | |
| Keyword(1) | Secondary Electron Emission Characteristics by Ion Bombardment |
| Keyword(2) | Automatic Measurement System |
| Keyword(3) | Nano-current Measurement |
| Keyword(4) | Protecting Layer |
| 1st Author's Name | S. Goto |
| 1st Author's Affiliation | Saga University() |
| 2nd Author's Name | T. Hirakawa |
| 2nd Author's Affiliation | Saga University |
| 3rd Author's Name | H. Uchiike |
| 3rd Author's Affiliation | Saga University |
| 4th Author's Name | Shoshu Chou |
| 4th Author's Affiliation | Saga University |
| Date | 2002/6/10 |
| Paper # | EID2002-4 |
| Volume (vol) | vol.102 |
| Number (no) | 121 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |