| Presentation | 2002/6/20 Problems in Detecting Maximum Values of Interference Using VCCI Test Method : Uncertainty in measuring interference pattern resulting from reflection on a metallic ground Shigekazu Shibuya, Haruo Ishizuka, Akinori Kameshima, Hideya Andou, Kazuaki Yoshimura, Yutaka Ohno, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | EMI test methods by Recommendation CISPR16, 22 basing on measuring maximum values of electric field intensity in antenna height scanning coping with the possible interference pattern consume a long time for test works, then needs to improve the efficiency of the measurement. Use of the VCCI Simplified Test Method can shorten the time for measurement greatly and produces test results similar to those according to the CISPR recommendations through omitting the antenna height scanning but fixing the receiving antenna height at 4 m for horizontal polarization and at 1 m for vertical polarization. This paper provides discussions to prove that uncertainty found in measurements by the VCCI simplified method may reach even 20 to 40 dB according to analysis of the frequency characteristics of the interference pattern caused by reflection by the metallic ground and that shifting test site from the metallic ground type to the free-space type should be the only way to enhance accuracy of the EMC measurement and improve the test work efficiency. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EMC / EMI / VCCI / Metallic ground / Free space / U-site |
| Paper # | AP2002-35 |
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| Conference Information | |
| Committee | AP |
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| Conference Date | 2002/6/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Antennas and Propagation (A・P) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Problems in Detecting Maximum Values of Interference Using VCCI Test Method : Uncertainty in measuring interference pattern resulting from reflection on a metallic ground |
| Sub Title (in English) | |
| Keyword(1) | EMC |
| Keyword(2) | EMI |
| Keyword(3) | VCCI |
| Keyword(4) | Metallic ground |
| Keyword(5) | Free space |
| Keyword(6) | U-site |
| 1st Author's Name | Shigekazu Shibuya |
| 1st Author's Affiliation | Shibuya, Ishizuka and Kameshinia's Consultant office() |
| 2nd Author's Name | Haruo Ishizuka |
| 2nd Author's Affiliation | Shibuya, Ishizuka and Kameshinia's Consultant office |
| 3rd Author's Name | Akinori Kameshima |
| 3rd Author's Affiliation | Shibuya, Ishizuka and Kameshinia's Consultant office |
| 4th Author's Name | Hideya Andou |
| 4th Author's Affiliation | Touin Yokohama University |
| 5th Author's Name | Kazuaki Yoshimura |
| 5th Author's Affiliation | Touin Yokohama University |
| 6th Author's Name | Yutaka Ohno |
| 6th Author's Affiliation | Systemtechnico Co Ltd. |
| Date | 2002/6/20 |
| Paper # | AP2002-35 |
| Volume (vol) | vol.102 |
| Number (no) | 146 |
| Page | pp.pp.- |
| #Pages | 10 |
| Date of Issue | |