| Presentation | 2004/4/9 Effect of Chain Length for Ferroelectric Vinylidene Fluoride Oligomer Shuichiro KUWAJIMA, Kenji ISHIDA, Kazuyuki MOCHIZUKI, Kei NODA, Toshihisa HORIUCHI, Hirofumi YAMADA, Kazumi MATSUSHIGE, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Ferroelectric and structural properties of vinylidene fluoride (VDF) oligomer CF_3-(CH_2CF_2)_n-I (n=12, 21 and 29) thin films have been investigated with varying of molecular chain length which is one of the most important physical parameters on oligomeric materials. Each structural controlled VDF oligomer exhibits clear ferroelectric property. As for VDF (29), the coercive electric field decreases unlike in the case of VDF(12) and (21) and the polarization switching current peak against applied electric field becomes broader. Moreover, the critical angle of X-ray reflectivity measured for long chain oligomer (29) film was smaller value than the others. Therefore, it is suggested that the coercive electric field decrease due to low crystallinity of long chain oligomer film. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | VDF oligomer / D-E hysteresis / polarization switching / organic ferroelectric material / X-ray reflectivity |
| Paper # | ED2004-14,SDM2004-14,OME2004-14 |
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| Conference Information | |
| Committee | OME |
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| Conference Date | 2004/4/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Organic Material Electronics (OME) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Effect of Chain Length for Ferroelectric Vinylidene Fluoride Oligomer |
| Sub Title (in English) | |
| Keyword(1) | VDF oligomer |
| Keyword(2) | D-E hysteresis |
| Keyword(3) | polarization switching |
| Keyword(4) | organic ferroelectric material |
| Keyword(5) | X-ray reflectivity |
| 1st Author's Name | Shuichiro KUWAJIMA |
| 1st Author's Affiliation | Nanotechnology Support Project, Kyoto University() |
| 2nd Author's Name | Kenji ISHIDA |
| 2nd Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
| 3rd Author's Name | Kazuyuki MOCHIZUKI |
| 3rd Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
| 4th Author's Name | Kei NODA |
| 4th Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
| 5th Author's Name | Toshihisa HORIUCHI |
| 5th Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
| 6th Author's Name | Hirofumi YAMADA |
| 6th Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
| 7th Author's Name | Kazumi MATSUSHIGE |
| 7th Author's Affiliation | Department of Electronic Science and Engineering, Kyoto University |
| Date | 2004/4/9 |
| Paper # | ED2004-14,SDM2004-14,OME2004-14 |
| Volume (vol) | vol.104 |
| Number (no) | 7 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |