Presentation | 2003/9/12 Evaluation of Huang-Rhys factors of poly(9,9-dioctylfluorene) thin films by photoluminescence spectroscopy K Asada, S Ikame, H Naito, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A study of temperature dependence of the strength of electron-phonon interaction, which is evaluated from Huang-Rhys factors in poly(9,9-dioctylfluorene) (PFO) thin films, has been reported. It is found that electron-phonon interaction is enhanced with increasing temperature. This indicates that the conjugation length in PFO is reduced with increasing temperature. The insight into ocnjugation length in annealed and UV light-soaked PFO has also gained. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Poly(9,9-dioctylfluorene) (PFO) / annealed PFO / UV light-soaked PFO / Huang-Rhys factor |
Paper # | OME2003-72 |
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Committee | OME |
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Conference Date | 2003/9/12(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Organic Material Electronics (OME) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Evaluation of Huang-Rhys factors of poly(9,9-dioctylfluorene) thin films by photoluminescence spectroscopy |
Sub Title (in English) | |
Keyword(1) | Poly(9,9-dioctylfluorene) (PFO) |
Keyword(2) | annealed PFO |
Keyword(3) | UV light-soaked PFO |
Keyword(4) | Huang-Rhys factor |
1st Author's Name | K Asada |
1st Author's Affiliation | Department of Physics and Electronics, Osaka Prefecture University.() |
2nd Author's Name | S Ikame |
2nd Author's Affiliation | Department of Physics and Electronics, Osaka Prefecture University. |
3rd Author's Name | H Naito |
3rd Author's Affiliation | Department of Physics and Electronics, Osaka Prefecture University. |
Date | 2003/9/12 |
Paper # | OME2003-72 |
Volume (vol) | vol.103 |
Number (no) | 317 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |